2018
DOI: 10.1016/j.jlumin.2018.02.034
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Temperature dependence of 4fn−15d1→4fn luminescence of Ce3+ and Pr3+ ions in Sr2GeO4 host

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Cited by 25 publications
(17 citation statements)
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“…In order to confirm the phase purity of the synthesized compositions the XRD measurements were performed and analyzed. The experimental results are basically identical with those published previously for Sr 2 GeO 4 :Pr 3+ and are presented in Figure S1 (Supporting Information). Comparisons of the position and intensity of the diffraction lines of the obtained samples with the simulated diffractogram of α‐Sr 2 GeO 4 (ICSD # 83345) confirm the phase purity of the Sr 2 (Ge 0.75 ,Si 0.25 )O 4 :0.05%Pr 3+ and Sr 2 (Ge 0.5 ,Si 0.5 )O 4 :0.05%Pr 3+ powders.…”
Section: Resultssupporting
confidence: 89%
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“…In order to confirm the phase purity of the synthesized compositions the XRD measurements were performed and analyzed. The experimental results are basically identical with those published previously for Sr 2 GeO 4 :Pr 3+ and are presented in Figure S1 (Supporting Information). Comparisons of the position and intensity of the diffraction lines of the obtained samples with the simulated diffractogram of α‐Sr 2 GeO 4 (ICSD # 83345) confirm the phase purity of the Sr 2 (Ge 0.75 ,Si 0.25 )O 4 :0.05%Pr 3+ and Sr 2 (Ge 0.5 ,Si 0.5 )O 4 :0.05%Pr 3+ powders.…”
Section: Resultssupporting
confidence: 89%
“…The activation energy E a = 0.15 eV of thermal quenching was calculated using the single‐barrier model described by Equation p =1τ =1τ0 +BexpEakBT where p and τ are the rate of luminescence transition and its decay time at temperature ( T ), respectively, τ o is the radiative decay time of a given luminescence (when quenching is not present), B is a constant depending on the radiative and nonradiative decay rates, and k B is the Boltzmann constant (8.617 × 10 −5 eV K −1 ). Surprisingly, the obtained E a = 0.15 ± 0.01 eV does not differ from what was found previously for the Si‐free Sr 2 GeO 4 :Pr 3+ . As we will discuss next, the E a barrier will increase out of the measurement uncertainty as anticipated only upon even higher content of Si in Sr 2 (Ge 0.5 ,Si 0.5 )O 4 :Pr 3+ materials.…”
Section: Resultssupporting
confidence: 42%
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