2011
DOI: 10.1117/12.874863
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Temperature and current accelerated lifetime conditions and testing of laser diodes for ESA BepiColombo space mission

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Cited by 5 publications
(3 citation statements)
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“…The LD is sensitive to temperature and current stress based on fault tree analysis, failure mechanism and effect analysis. An Arrhenius type model can be used for LD aging test with temperature stress, and a power law type model can be used for LD aging test with current stress [12] . However, in the experimental aging process, the influence of current and temperature on the laser is inseparable, and the current through the LD will generate heat.…”
Section: Reliable Physical Model For Accelerated Aging Of Gan -Based Ldmentioning
confidence: 99%
“…The LD is sensitive to temperature and current stress based on fault tree analysis, failure mechanism and effect analysis. An Arrhenius type model can be used for LD aging test with temperature stress, and a power law type model can be used for LD aging test with current stress [12] . However, in the experimental aging process, the influence of current and temperature on the laser is inseparable, and the current through the LD will generate heat.…”
Section: Reliable Physical Model For Accelerated Aging Of Gan -Based Ldmentioning
confidence: 99%
“…During short "hot" phases, the junction temperatures may rise to ≈340 K (67°C). The activation energy E a 0.46 0.23 eV is in the normal range for III-V single quantum-well diode lasers and has been studied in more detail elsewhere [51]. Further tests at increased diode laser currents up to 150 A have been performed to demonstrate safe operation at increased diode laser drive currents of 100 A needed for the BELA application [51].…”
Section: A Space Qualification Of the Pump Diode Lasersmentioning
confidence: 99%
“…The wear-out lifetime τ of the LDAs R-8 by SCD has been experimentally established from dedicated accelerated life tests at various increased operation temperatures and at several elevated electrical drive currents [51]. The tests at different temperatures lead to the so-called activation energy E a in eV.…”
Section: A Space Qualification Of the Pump Diode Lasersmentioning
confidence: 99%