Electron Energy-Loss Spectroscopy in the Electron Microscope 2011
DOI: 10.1007/978-1-4419-9583-4_5
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TEM Applications of EELS

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Cited by 18 publications
(22 citation statements)
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“…To acquire the spectroscopic data, the so-called spectrum imaging technique was adopted. 24 In this technique, the electron probe is scanned over the sample and an EELS spectrum is acquired in each point, together with an annular dark-field signal as image reference.…”
Section: This Journal Is ª the Royal Society Of Chemistry 2012mentioning
confidence: 99%
See 1 more Smart Citation
“…To acquire the spectroscopic data, the so-called spectrum imaging technique was adopted. 24 In this technique, the electron probe is scanned over the sample and an EELS spectrum is acquired in each point, together with an annular dark-field signal as image reference.…”
Section: This Journal Is ª the Royal Society Of Chemistry 2012mentioning
confidence: 99%
“…The fine structure of EELS edges (the so-called energy-loss near-edge structure (ELNES) signature) is known to be sensitive to the local environment of the excited atom through the projected density of unoccupied states. 24,25 The ELNES signature of the boron K-edge and carbon K-edge in these films should therefore contain information on the local B environment. To obtain a sufficient signal to noise ratio for ELNES investigation, EELS spectra were acquired from a diamond-rich and an amorphous carbon-rich region in diffraction mode, using longer acquisition times than for the STEM-EELS data.…”
Section: This Journal Is ª the Royal Society Of Chemistry 2012mentioning
confidence: 99%
“…One can estimate liquid thickness by comparing electron beam currents with and without samples in TEM, at best with some 30% accuracy 29,30 . However, electron energy loss spectroscopy (EELS) is the most frequently used method to calculate liquid sample thickness in TEM based on the log-ratio model that measures thickness relative to the inelastic mean free path (λ IMFP ) 31 .…”
mentioning
confidence: 99%
“…Inner-shell excitations, although less frequent than valence excitations for light elements, deposit more energy in the sample, increasing their contribution to stopping power. The relative contributions of these processes can be judged directly from the features in energy-loss spectra from proteins ( Sun et al , 1993 and Egerton, 2011 ). We will therefore neglect all processes except valence electron excitation, which has been extensively studied by energy-loss spectroscopy in TEM, interpreted using the dielectric response theory ( Howie, 2003 ).…”
Section: Comparison Of X-ray and Electron Interactionsmentioning
confidence: 99%