Iron Oxides 2016
DOI: 10.1002/9783527691395.ch14
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TEM and Associated Techniques

Abstract: Common Abbreviations ADF annular dark field AEM analytical electron microscopy BF bright field CCD charge-coupled device CCF cross-correlated function DF dark field DP diffraction pattern EELS electron energy-loss spectrometry EFI energy-filtered imaging EFTEM energy-filtered transmission electron microscopy EH electron holography ELNES energy-loss near-edge structure ETEM environmental transmission electron microscopy eV electron volt EXAFS extended X-ray absorption fine structure FEG field-emission electron … Show more

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References 191 publications
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