1996
DOI: 10.1016/s0925-8388(96)02497-8
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Tellurium activities across the AlAl2Te3 system

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Cited by 4 publications
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“…Generally, the formation energy of Al 2 Te 3 is relatively low (−0.71 eV atom −1 ) in Al-Te systems, and further referring to Al-Te binary phase diagram, this IRL is deemed to be mainly composed of Al 2 Te 3 . [57,58] In Figure S21, Supporting Information, the growth rate of the Al 2 Te 3 layer is rapid with increasing aging time, and this layer is found to be brittle at the Al/Ge 0.9 Sb 0.1 Te interface. Li et al reported that the thickness of the Al 2 Te 3 layer increases rapidly from ≈8 to ≈23 μm at Al 66 Si 34 /Ge 0.9 Sb 0.1 TeB 0.01 interface after 16 days of aging.…”
Section: Reliability Of Ti-34al/ge09sb01te Jointsmentioning
confidence: 99%
“…Generally, the formation energy of Al 2 Te 3 is relatively low (−0.71 eV atom −1 ) in Al-Te systems, and further referring to Al-Te binary phase diagram, this IRL is deemed to be mainly composed of Al 2 Te 3 . [57,58] In Figure S21, Supporting Information, the growth rate of the Al 2 Te 3 layer is rapid with increasing aging time, and this layer is found to be brittle at the Al/Ge 0.9 Sb 0.1 Te interface. Li et al reported that the thickness of the Al 2 Te 3 layer increases rapidly from ≈8 to ≈23 μm at Al 66 Si 34 /Ge 0.9 Sb 0.1 TeB 0.01 interface after 16 days of aging.…”
Section: Reliability Of Ti-34al/ge09sb01te Jointsmentioning
confidence: 99%