2001
DOI: 10.2172/776185
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Technology Support for High-Throughput Processing of Thin-Film CdTe PV Modules Annual Technical Report, Phase II

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Cited by 2 publications
(2 citation statements)
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“…In Phase II, we introduced planar EBIC (electron-beam induced current) as a potential for a very-high-acceleration factor stress test [19,20,30]. Analysis of statistics from the first 16 plates (6 cells per plate) showed a correlation coefficient of 0.58 between 20 sec of EBIC exposure and 14 days of OC light soak.…”
Section: Ebic Accelerated-test Technique Developmentmentioning
confidence: 99%
“…In Phase II, we introduced planar EBIC (electron-beam induced current) as a potential for a very-high-acceleration factor stress test [19,20,30]. Analysis of statistics from the first 16 plates (6 cells per plate) showed a correlation coefficient of 0.58 between 20 sec of EBIC exposure and 14 days of OC light soak.…”
Section: Ebic Accelerated-test Technique Developmentmentioning
confidence: 99%
“…(iii) One kilowatt CdTe PV arrays have been ®eld tested for up to 5 years and continue to display good stability Ð degradation less than 1% relative degradation per year. 1 In many ways polycrystalline CdTe PV technology has surpassed its early expectations. 2 Perhaps somewhat surprisingly, CdTe PV has not accomplished the goal which most observers thought would be the easiest to achieve Ð low costs.…”
Section: Introductionmentioning
confidence: 99%