2020
DOI: 10.1016/j.mejo.2020.104911
|View full text |Cite
|
Sign up to set email alerts
|

Technological and devices modeling of complementary JFETs over a wide temperature range

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 17 publications
0
1
0
Order By: Relevance
“…The use of complementary JFETs, which are mastered in the framework of a number of modern technological processes [10,11], provides a low noise level and increased resistance of analog microcircuits to the effects of penetrating radiation. For many problems of analog circuitry, floating FDSs are promising not only on silicon JFETs, but also on JFETs based on SiC, GaN, GaAs transistors [12].…”
Section: Introductionmentioning
confidence: 99%
“…The use of complementary JFETs, which are mastered in the framework of a number of modern technological processes [10,11], provides a low noise level and increased resistance of analog microcircuits to the effects of penetrating radiation. For many problems of analog circuitry, floating FDSs are promising not only on silicon JFETs, but also on JFETs based on SiC, GaN, GaAs transistors [12].…”
Section: Introductionmentioning
confidence: 99%