Technique to automatically measure electron-beam diameter and astigmatism:<scp>BEAMETR</scp>

Babin, S.; Gaevski, Mikhail; Joy, David C.; Machin, M.; Martynov, A. I.

doi:10.1116/1.2387158

Cited by 24 publications

(28 citation statements)

References 4 publications

(1 reference statement)

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“…The widespread use of SEM became possible after 1958, when researchers from Cambridge (UK) built the first commercial prototype [13]. The typical primary electron beam used in a SEM is of 1-30 kV, with a beam current of 1 pA to 20 nA that can be focused in about 2-100-nm spot size, depending on the emitter source [14,15]. A detailed description of the SEM operation can be found in [16].…”

Section: Scanning Electron Microscopy (Sem)mentioning

confidence: 99%

How to Characterize Cylindrical Magnetic Nanowires

Béron¹,

Santos²,

deCarvalho³

et al. 2016

Magnetic Materials

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Cylindrical magnetic nanowires made through the help of nanoporous alumina templates are being fabricated and characterized since the beginning of 2000. They are still actively investigated nowadays, mainly due to their various promising applications, ranging from high-density magnetic recording to high-frequency devices, passing by sensors, and biomedical applications. They also represent suitable systems in order to study the dimensionality effects on a given material. With time, the development in fabrication techniques allowed to increase the obtained nanowire complexity (controlled crystallinity, modulated composition and/or geometry, range of materials, etc.), while the improvements in nanomanipulation permitted to fabricate system based either on arrays or on single nanowires. On the other side, their increased complexity requires specific physical characterization methods, due to their particular features such as high anisotropy, small magnetic volume, dipolar interaction field between them, and interesting electronic properties. The aim of this chapter was to offer an ample overview of the magnetic, electric, and physical characterization techniques that are suitable for cylindrical magnetic nanowire investigation, of what is the specific care that one needs to take into account and which information will be extracted, with typical and varied examples.

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Section: Scanning Electron Microscopy (Sem)mentioning

confidence: 99%

How to Characterize Cylindrical Magnetic Nanowires

Béron¹,

Santos²,

deCarvalho³

et al. 2016

Magnetic Materials

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“…This method generally works for probe sizes down to a few nanometer, [Ris84 Kra88] although it has potential sources of error. [Bab06] A different method is using a point projection microscope, [Jon04 Fra96] but to extract a size from the experimental Fresnel fringes patterns one has to assume the shape of the source intensity distribution. Also Fourier methods have been applied, [Joy02] but a routine that can deal with unknown probe shapes is still under development.…”

Section: How To Get the Practical Brightness Of A Sourcementioning

confidence: 99%

Physics of Schottky Electron Sources

Bronsgeest¹

2016

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“…The test sample consists of a piece of silicon containing a nanoscale pattern with a known spatial frequency spectrum. Because the spatial frequency spectrum of a recorded image is a function of the beam diameter, a mathematical algorithm can be used to extract the beam diameter from an SEM image of the test pattern (Babin et al, 2006). Monte Carlo simulations using the Casino 2.42 software (Hovington et al, 1997;Drouin et al, 2007) were then performed to determine the size and shape of the X-ray emission volume within the brass target.…”

Section: Sem Imaging Edx Analysis and Resolution Testmentioning

confidence: 99%

High-resolution 3D analyses of the shape and internal constituents of small volcanic ash particles: The contribution of SEM micro-computed tomography (SEM micro-CT)

Vonlanthen

Rausch

Ketcham

et al. 2015

Journal of Volcanology and Geothermal Research

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The morphology of small volcanic ash particles is fundamental to our understanding of magma fragmentation, and in transport modeling of volcanic plumes and clouds. Until recently, the analysis of 3D features in small objects (b250 μm) was either restricted to extrapolations from 2D approaches, partial stereo-imaging, or CT methods having limited spatial resolution and/or accessibility. In this study, an X-ray computed-tomography technique known as SEM micro-CT, also called 3D X-ray ultramicroscopy (3D XuM), was used to investigate the 3D morphology of small volcanic ash particles (125-250 μm sieve fraction), as well as their vesicle and microcrystal distribution. The samples were selected from four stratigraphically well-established tephra layers of the Meerfelder Maar (West Eifel Volcanic Field, Germany). Resolution tests performed on a Beametr v1 pattern sample along with Monte Carlo simulations of X-ray emission volumes indicated that a spatial resolution of 0.65 μm was obtained for X-ray shadow projections using a standard thermionic SEM and a bulk brass target as X-ray source. Analysis of a smaller volcanic ash particle (64-125 μm sieve fraction) showed that features with volumes N 20 μm 3 (~3.5 μm in diameter) can be successfully reconstructed and quantified. In addition, new functionalities of the Blob3D software were developed to allow the particle shape factors frequently used as input parameters in ash transport and dispersion models to be calculated. This study indicates that SEM micro-CT is very well suited to quantify the various aspects of shape in fine volcanic ash, and potentially also to investigate the 3D morphology and internal structure of any object b 0.1 mm 3 .

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Technique to automatically measure electron-beam diameter and astigmatism:BEAMETR

Cited by 24 publications

References 4 publications

How to Characterize Cylindrical Magnetic Nanowires

How to Characterize Cylindrical Magnetic Nanowires

Physics of Schottky Electron Sources

High-resolution 3D analyses of the shape and internal constituents of small volcanic ash particles: The contribution of SEM micro-computed tomography (SEM micro-CT)

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