Technical note: Error analysis of material‐decomposition‐based effective atomic number quantification method
Li Chen,
Xu Ji,
Zhe Wang
et al.
Abstract:BackgroundThe effective atomic number (Zeff) is widely applied to the identification of unknown materials. One method to determine the Zeff is material‐decomposition‐based spectral X‐ray imaging. The method relies on certain approximations of the X‐ray interaction cross‐sections such as empirical model coefficients. The impact of such approximations on the accuracy of Zeff quantification has not been fully investigated.PurposeTo perform an error analysis of the material‐decomposition‐based Zeff quantification … Show more
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