IEEE International Conference on Group IV Photonics, 2005. @Nd
DOI: 10.1109/group4.2005.1516426
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TE/TM mode conversion in silicon waveguides using selective stress applying oxide patches and etched oxide windows

Abstract: We demonstrate TE/TM mode conversion in silicon waveguides. The application of stress by oxide patches and etched oxide windows respectively enabled over 40% polarization conversion and allowed operation over a wide wavelength range.

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Cited by 2 publications
(2 citation statements)
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“…However, the effect of strain on the shift of resonance wavelength is complex, because the strain not only enhances the EO effect but also changes refractive index, which is known as the photoelastic effect. 6,7) The photoelastic effect has been utilized for pressure sensors, 8) optical polarizing devices, 9,10) and stress sensors on Si wafers. 11) In this study, we focus on the photoelastic effect of Si to clarify the effect of strain on small Si optical devices.…”
Section: Introductionmentioning
confidence: 99%
“…However, the effect of strain on the shift of resonance wavelength is complex, because the strain not only enhances the EO effect but also changes refractive index, which is known as the photoelastic effect. 6,7) The photoelastic effect has been utilized for pressure sensors, 8) optical polarizing devices, 9,10) and stress sensors on Si wafers. 11) In this study, we focus on the photoelastic effect of Si to clarify the effect of strain on small Si optical devices.…”
Section: Introductionmentioning
confidence: 99%
“…Figure 5 (a) shows the schematic structure of the polarization rotator, and (b) shows the top-view SEM image of the fabricated device structure. A SiO 2 patch was formed along the Si waveguide structure because it is thought that the deposited patch creates a stress field in the waveguide [4]. The stress also causes distribution of a refractive index change in the Si waveguide, so the polarization of input light should be rotated.…”
Section: Polarization Rotatormentioning
confidence: 99%