2003
DOI: 10.1088/0268-1242/18/7/302
|View full text |Cite
|
Sign up to set email alerts
|

Te-doped cadmium telluride films fabricated by close spaced sublimation

Abstract: Te-doped cadmium telluride (CdTe) films were deposited on ITO/glass substrates using the close spaced sublimation (CSS) method. The films were characterized by x-ray diffraction (XRD), the x-ray fixed-quantity (XRF) method, scanning electron microscopy (SEM) and the Hall effect. The XRD and SEM results show that appropriate Te doping would be favourable to the growth of CdTe crystallite. The Hall effect measurements indicate that the conductivity of CdTe films could be dramatically improved by Te doping. The w… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
14
0

Year Published

2005
2005
2024
2024

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 18 publications
(15 citation statements)
references
References 14 publications
1
14
0
Order By: Relevance
“…Thus, the incorporation of extra Te leads to the expansion of the CdTe lattice. A similar observation has been reported by Li et al [14]. The change in intensities was also observed.…”
Section: Resultssupporting
confidence: 91%
See 2 more Smart Citations
“…Thus, the incorporation of extra Te leads to the expansion of the CdTe lattice. A similar observation has been reported by Li et al [14]. The change in intensities was also observed.…”
Section: Resultssupporting
confidence: 91%
“…In general, as-prepared CdTe films, fabricated by various techniques, show a high electrical resistivity (10 7 -10 9 O cm) at room temperature [14]. The change in sheet resistance and resistivity of the samples as function of Te content at temperature 200 1C is shown in Table 1.…”
Section: Article In Pressmentioning
confidence: 98%
See 1 more Smart Citation
“…The beam was scanned over 10mmx IOmm area on the sample using a magnetic beam scanner. The dose of charge accumulated in the sample was measured separately in terms of fluences and the following fluences were used: lxlO ll , lxl0 12 , lxl0 13 A Rich Seifert X-ray diffractometer with monochromatic wavelength of 1.5405 (Cu Ka) was used to record the diffraction pattern. A CZT sample with a size of 7x7x3 mm 3 was used in our work.…”
Section: Methodsmentioning
confidence: 99%
“…[1][2][3][4][5][6][7] Also, chalcopyrite I-III-VI 2 compounds have recently attracted attention as potential components for semiconductor devices, including applications in solar cells and electrooptic devices. [8][9][10] In particular, CuInSe 2 has already become widely used in making commercial solar cells.…”
Section: Introductionmentioning
confidence: 99%