TCAD Simulation of Single-Event Transient and Hardening in 700V LDMOS Transistors

Lei, Yibo; Fang, Jian; Zhang, Bo

doi:10.1109/iccss55260.2022.9802359

2022 5th International Conference on Circuits, Systems and Simulation (ICCSS) 2022

DOI: 10.1109/iccss55260.2022.9802359

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TCAD Simulation of Single-Event Transient and Hardening in 700V LDMOS Transistors

Yibo Lei

Jian Fang

Bo Zhang

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TCAD Simulation of Single-Event Transient and Hardening in 700V LDMOS Transistors

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References 28 publications

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