2023
DOI: 10.1039/d3ta00493g
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Targeting the imperfections at the ZnO/CsPbI2Br interface for low-temperature carbon-based perovskite solar cells

Abstract: Zinc oxide (ZnO) is an appealing electron transport layer for inorganic perovskite solar cells (IPSCs). However, the attempts to achieve high device performance have been undermined by the imperfections at...

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Cited by 9 publications
(5 citation statements)
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“…The scanning electron microscope (SEM) characterization of the surface morphologies for the CsPbI 2 Br films without and with the PhDADI modification is shown in Figure a,b, respectively. It is evident that compared with the control sample with pinholes (see the white indication arrows), the PhDADI-modified CsPbI 2 Br film is more compact and free of pinholes, , which directly supports the above discussion for the enhanced light absorbance of the corresponding sample in Figure c. Moreover, as a distinct contrast from the SEM images, the grain size is evidently increased for the CsPbI 2 Br film with the statistical average value of 399 nm after the PhDADI modification, much larger than that of 263 nm for the control sample (see Figure S2 for the statistical distribution bar charts), consistent with the XRD characterization.…”
Section: Resultssupporting
confidence: 77%
“…The scanning electron microscope (SEM) characterization of the surface morphologies for the CsPbI 2 Br films without and with the PhDADI modification is shown in Figure a,b, respectively. It is evident that compared with the control sample with pinholes (see the white indication arrows), the PhDADI-modified CsPbI 2 Br film is more compact and free of pinholes, , which directly supports the above discussion for the enhanced light absorbance of the corresponding sample in Figure c. Moreover, as a distinct contrast from the SEM images, the grain size is evidently increased for the CsPbI 2 Br film with the statistical average value of 399 nm after the PhDADI modification, much larger than that of 263 nm for the control sample (see Figure S2 for the statistical distribution bar charts), consistent with the XRD characterization.…”
Section: Resultssupporting
confidence: 77%
“…1a), indicating the strong electron interaction between NiO x and TFOA. 29,30 This interaction could effectively improve the surface chemical environment of NiO x films by reducing the undesired Ni 3+ content through TFOA passivation (Fig. S4, ESI†), which is favorable for the hole-acceptation capacity of NiO x HTL.…”
Section: Resultsmentioning
confidence: 99%
“…[ 1‐5 ] In the past decade, the power conversion efficiency (PCE) of single‐junction PSCs has rapidly developed from 3.8% to the certified 25.8% in 2023. [ 6‐15 ] These prominent achievements are usually made from lead‐based perovskites (PVKs). [ 16 ] However, their inevitable toxicity and environmental unfriendliness have triggered the exploration of lead‐free or lead‐less PSCs.…”
Section: Background and Originality Contentmentioning
confidence: 99%