Targeting different defect-oriented fault models in IC testing: an experimental approach

Mirabella, N.; Floridia, A.; Cantoro, R.; Grosso, M.; Reorda, M. Sonza

doi:10.1109/dsd60849.2023.00039

2023 26th Euromicro Conference on Digital System Design (DSD) 2023

DOI: 10.1109/dsd60849.2023.00039

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Targeting different defect-oriented fault models in IC testing: an experimental approach

N. Mirabella,

A. Floridia,

R. Cantoro

et al.

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Targeting different defect-oriented fault models in IC testing: an experimental approach

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References 12 publications

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