2018
DOI: 10.1103/physrevb.97.125301
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Tailoring topological states in silicene using different halogen-passivated Si(111) substrates

Abstract: We investigate the band structure and topological phases of silicene embedded on halogenated Si(111) surface, by virtue of density functional theory calculations. Our results show that the Dirac character of low energy excitations in silicene is almost preserved in the presence of silicon substrate passivated by various halogens. Nevertheless, the combined effects of symmetry breaking due to both direct and van der Waals interactions between silicene and the substrate, charge transfer from suspended silicene i… Show more

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Cited by 2 publications
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“…Because of the relatively weak van der Waals interaction between contiguous layers, 2D layered materials with ultrathin thickness can be effortlessly realized through mechanical exfoliation or chemical vapor deposition (CVD). However, there are also many nonlayered materials such as group IVA, 22 II−VI, 23 and III− VA 24 semiconductors with excellent electronic and optoelectronic properties. 25 Ge is famed for the high carrier mobilities (electron: μ e = 3900 cm 2 V −1 s −1 , hole: μ h = 1900 cm 2 V −1 s −1 ), a narrow bandgap of 0.67 eV in the bulk phase at 300 K, and large absorption coefficient of 2 × 10 5 cm −1 , rendering it an excellent candidate for near-infrared (NIR) photodetection.…”
Section: ■ Introductionmentioning
confidence: 99%
“…Because of the relatively weak van der Waals interaction between contiguous layers, 2D layered materials with ultrathin thickness can be effortlessly realized through mechanical exfoliation or chemical vapor deposition (CVD). However, there are also many nonlayered materials such as group IVA, 22 II−VI, 23 and III− VA 24 semiconductors with excellent electronic and optoelectronic properties. 25 Ge is famed for the high carrier mobilities (electron: μ e = 3900 cm 2 V −1 s −1 , hole: μ h = 1900 cm 2 V −1 s −1 ), a narrow bandgap of 0.67 eV in the bulk phase at 300 K, and large absorption coefficient of 2 × 10 5 cm −1 , rendering it an excellent candidate for near-infrared (NIR) photodetection.…”
Section: ■ Introductionmentioning
confidence: 99%