2023
DOI: 10.1149/2162-8777/ace47b
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Tailoring of Optical, Dielectric, and Structural Parameters of PVA by CdS-Ag Core-Shell Nanoparticles and UV Irradiation

Abstract: A chemical reduction process was employed for formation of CdS-Ag CSNs. Consequently, different weight percentages of these core shells were embedded in PVA. These films were exposed to UV radiation and changes in optical, structural, and dielectric parameters were observed. X-ray diffraction and transmission electron microscopy was done to establish formation of CSNs. By evaluation of UV-Vis data band gap of PVA was observed to reduce after embedding CSNs and linear and non-linear optical parameters like n0, … Show more

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Cited by 3 publications
(2 citation statements)
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“…This rise can be associated with cross-linking occurring within polymer chains leading to alteration among density and molecular weight allocation that leads to changes in the refractive index of prepared nanocomposites. 28 Omitting the lattice assistance in case of wavelength greater than phonon resonance, Wemple and DiDomenico analyzed n in a range less than intra-band absorption. 29 It was established that the energy reliance of n complies with Sellmeier's equation represented by Eq.…”
Section: Characterization Methodsmentioning
confidence: 99%
“…This rise can be associated with cross-linking occurring within polymer chains leading to alteration among density and molecular weight allocation that leads to changes in the refractive index of prepared nanocomposites. 28 Omitting the lattice assistance in case of wavelength greater than phonon resonance, Wemple and DiDomenico analyzed n in a range less than intra-band absorption. 29 It was established that the energy reliance of n complies with Sellmeier's equation represented by Eq.…”
Section: Characterization Methodsmentioning
confidence: 99%
“…Complex dielectric permittivity is combination of real (ε′) and imaginary (ε″) component [40] as shown in equation ( 5) and investigation of frequency dependent dielectric parameters was done using Wayne Kerr 6500B impedance analyzer.…”
Section: Dielectric Analysismentioning
confidence: 99%