Systematic Signal Integrity Analysis on Fine Pitch Probe Card for HBM Interposer Testing

Li, Kangrong; Umralkar, Ratan Bhimrao

doi:10.1109/eptc53413.2021.9663999

2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC) 2021

DOI: 10.1109/eptc53413.2021.9663999

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Systematic Signal Integrity Analysis on Fine Pitch Probe Card for HBM Interposer Testing

Kangrong Li

Ratan Bhimrao Umralkar

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Systematic Signal Integrity Analysis on Fine Pitch Probe Card for HBM Interposer Testing

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