2021
DOI: 10.1007/s12034-021-02380-y
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Systematic effects of Ti doping on the electronic properties of LaNiO3 thin films

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Cited by 4 publications
(6 citation statements)
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“…Though the variation of τ (Λ) values with the Ni content seems to be weakly significant, an overall decreasing (increasing) trend in τ (Λ) values with Ni incorporation is noticed. Λ stands for the coherence of vibrational modes and measures the disorders in a system [43]. Variation of FWHM, i.e., Λ with Ni content indicates a plausible increase in disorder in Sb 2−x Ni x Te 3 samples [43,45] and corroborates with the B iso values.…”
Section: Vibrational Properties Andκsupporting
confidence: 64%
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“…Though the variation of τ (Λ) values with the Ni content seems to be weakly significant, an overall decreasing (increasing) trend in τ (Λ) values with Ni incorporation is noticed. Λ stands for the coherence of vibrational modes and measures the disorders in a system [43]. Variation of FWHM, i.e., Λ with Ni content indicates a plausible increase in disorder in Sb 2−x Ni x Te 3 samples [43,45] and corroborates with the B iso values.…”
Section: Vibrational Properties Andκsupporting
confidence: 64%
“…The schematic diagram corresponding to the Raman active phonon modes A 1 1g , E 2 g , A 2 1g of Nidoped Sb 2 Te 3 is displayed in figure 3. Careful observation reveals a blue shift in the peak position of vibrational phonon modes with Ni doping, indicating an increase of compressive strain with increasing Ni concentration [43]. In Sb 2−x Ni x Te 3 , Sb is replaced by Ni atoms of smaller atomic radii.…”
Section: Vibrational Properties Andκmentioning
confidence: 98%
“…% Cu incorporated samples may be caused by the increased crystallite size as noticed in XRD. Also, the Raman modes were shifted slightly to the higher wavenumber side after Cu incorporation suggesting that Cu induces compressive strain in the samples …”
Section: Resultsmentioning
confidence: 99%
“…Also, the Raman modes were shifted slightly to the higher wavenumber side after Cu incorporation suggesting that Cu induces compressive strain in the samples. 43 Figure 3 shows the scanning electron microscopy (SEM) images of pristine and copper-incorporated Mn 3 O 4 thin films at a magnification of 40 KX. From the images, it is clear that the Cu addition has significantly changed the morphology of films.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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