Synthesis of yttriumtrihydride films for ex-situ measurements

Huiberts, J. N.; Rector, J.H.; Wijngaarden, Rinke J.; Jetten, S.; Groot, de D.G.; Dam, B.; Koeman, N.J.; Griessen, R.; Hjörvarsson, Bjørgvin; Ólafsson, S.; Cho, Y.S.

doi:10.1016/0925-8388(96)02286-4

Cited by 119 publications

(88 citation statements)

References 40 publications

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“…The oxide also has a tail that penetrates into the bulk of the film. This could be related to oxide channels growing at the crystal grain borders that have earlier been discussed for yttrium hydride 2 and pure yttrium 19 films. For pure yttrium films we found a surface oxide layer of ~5 nm and a similar oxygen penetration profile.…”

mentioning

confidence: 67%

“…A Pd cap layer is often used for oxidation protection and to catalyze hydrogen uptake. For samples prepared for optical and electrical measurements, the Pd layer is, however, often so thin that the surface partly oxidizes 2 . The thickness of the oxide layer and distribution of the oxygen in the film are hard to assess using conventional methods for compositional analysis as Rutherford backscattering (RBS).…”

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confidence: 99%

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Surface oxide on thin films of yttrium hydride studied by neutron reflectometry

Mongstad

Platzer‐Björkman

Mæhlen

et al. 2012

Applied Physics Letters

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The applicability of standard methods for compositional analysis is limited for H-containing films. Neutron reflectometry is a powerful, non-destructive method that is especially suitable for these systems due to the large negative scattering length of H. In this work we demonstrate how neutron reflectometry can be used to investigate thin films of yttrium hydride. Neutron reflectometry gives a strong contrast between the film and the surface oxide layer, enabling us to estimate the oxide thickness and oxygen penetration depths. A surface oxide layer of 5-10 nm thickness was found for unprotected yttrium hydride films.

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mentioning

confidence: 67%

mentioning

confidence: 99%

Surface oxide on thin films of yttrium hydride studied by neutron reflectometry

Mongstad

Platzer‐Björkman

Mæhlen

et al. 2012

Applied Physics Letters

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“…1 Pd capping of Y thin films allows for a reversible (de)hydrogenation. 2,3 The optical changes involved in the (de)hydrogenation process lead to intriguing findings such as the switchable mirror effect in YH x . 4 Depending on the H concentration, the Y-H system exhibits three structural phases.…”

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confidence: 99%

“…See supplementary material for further details regarding XRD analysis, XRD patterns of MH 2 and MO x H y thin films, optical spectroscopy methods, and bandgap determination. …”

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confidence: 99%

Photochromism of rare-earth metal-oxy-hydrides

Nafezarefi

Schreuders

Dam

et al. 2017

Applied Physics Letters

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104

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Recently, thin films of yttrium oxy-hydride (YOxHy) were reported to show an unusual color-neutral photochromic effect promising for application in smart windows. Our present work demonstrates that also oxy-hydrides based on Gd, Dy, and Er have photochromic properties and crystal structures similar to YOxHy. Compared to YOxHy, the optical bandgaps of the lanthanide based oxy-hydrides are smaller while photochromic contrast and kinetics show large variation among different cations. Based on these findings, we propose that cation alloying is a viable pathway to tailor the photochromic properties of oxy-hydride materials. Furthermore, we predict that the oxy-hydrides of the other lanthanides are also potentially photochromic.

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“…Since the first finding on the switching mirror of yttrium hydride, 1) metal-insulator transition in hydrogenation of metals has been a popular issue of research and development. Among various candidate metals and alloys, yttrium is still an attractive material to investigate the optical behavior of hydrides.…”

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confidence: 99%

Ellipsometric Characterization on Multi-Layered Thin Film Systems during Hydrogenation

2007

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Ellipsometric characterization on the basis of multi-layered modeling is proposed to describe the optical and electrical property transients of hydrogenated films. In particular, two-step modeling is developed to make ellipsometric characterization on the yttrium film and the palladium capped yttrium film deposited on the SiO 2 glass substrate. In the former, Y 2 O 3 film deposited on SiO 2 substrate is prepared to estimate the dielectric response of yttrium oxide layer as the first step. These data are further utilized in the second step to determine optical and electric properties of yttrium-base multi-layers which are composed of metallic yttrium, composite of metallic yttrium and Y 2 O 3 , and Y 2 O 3 layer with surface roughness. In the latter, a palladium film deposited on SiO 2 substrate is prepared to investigate the dielectric response of palladium hydrides. The estimated dispersion functions are further used in the multi-layered modeling for hydrogenated Pd-capped yttrium films on the SiO 2 substrate. Under the ambient hydrogen pressure, palladium coated yttrium films have low resistivity and hydrogenated yttrium is still metallic. This palladium coating works as a top capping layer for yttrium film during hydrogenation and de-hydrogenation.

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Synthesis of yttriumtrihydride films for ex-situ measurements

Cited by 119 publications

References 40 publications

Surface oxide on thin films of yttrium hydride studied by neutron reflectometry

Surface oxide on thin films of yttrium hydride studied by neutron reflectometry

Photochromism of rare-earth metal-oxy-hydrides

Ellipsometric Characterization on Multi-Layered Thin Film Systems during Hydrogenation

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