2008
DOI: 10.1016/j.jallcom.2007.04.261
|View full text |Cite
|
Sign up to set email alerts
|

Synthesis of Sr2MgSi2O7:Eu, Dy and Sr2MgSi2O7:Eu, Dy, Nd by a modified solid-state reaction and their luminescent properties

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
19
0
1

Year Published

2009
2009
2019
2019

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 43 publications
(21 citation statements)
references
References 12 publications
1
19
0
1
Order By: Relevance
“…Therefore the co-doping Dy 3+ and Nd 3+ can modify the trap depth in the host. This conforms to the previous research[14]. However, both the Nd 3+ and Dy 3+ are trivalent.…”
supporting
confidence: 93%
See 2 more Smart Citations
“…Therefore the co-doping Dy 3+ and Nd 3+ can modify the trap depth in the host. This conforms to the previous research[14]. However, both the Nd 3+ and Dy 3+ are trivalent.…”
supporting
confidence: 93%
“…Generally, the traps for holes or electrons of the phosphors are created by the lattice defects [14,24,25]. However, the significant detailed investigations are still insufficient.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Figure 2 shows the optical properties of the target material. The PL spectrum (Figure 2(a)) with an excitation wavelength of 276 nm had a main, broad, blue-green peak at 466 nm, which was attributed to the f-d transitions of Eu 2+ ions [22]. The strong peak at approximately 555 nm represents the second-order scattering of the excitation light.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The PLE spectrum (Figure 2(b)) with an emission wavelength of 466 nm has 2 peaks at 275 nm and 361 nm. These peaks are due to defect levels of the host material; therefore, the peak shape is changed by the synthesis method [22]. The increase in absorbance less than 237 nm was probably caused by band-edge absorption of the host material, whose bandgap was 7.1 eV (175 nm) [23].…”
Section: Experimental Methodsmentioning
confidence: 99%