1998
DOI: 10.1016/s0038-1098(97)10143-0
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Synthesis of nano-scale silicon wires by excimer laser ablation at high temperature

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Cited by 179 publications
(68 citation statements)
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“…The nanowire products covered approximately 30 mm in length of the Si substrate. The Si nanowires formed in this zone have been intensively studied previously by Lee et al 11,[14][15][16]18 Under optical microscopy, zone IV can be clearly divided into two regions with almost equal length by the color and morphology of the wires. In the front region (the corresponding temperature range is 1050-1180°C), light yellow nanowires closely attach to the surface of Si substrate to form a nanowire film.…”
Section: Zone IV (930-1180°c)mentioning
confidence: 99%
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“…The nanowire products covered approximately 30 mm in length of the Si substrate. The Si nanowires formed in this zone have been intensively studied previously by Lee et al 11,[14][15][16]18 Under optical microscopy, zone IV can be clearly divided into two regions with almost equal length by the color and morphology of the wires. In the front region (the corresponding temperature range is 1050-1180°C), light yellow nanowires closely attach to the surface of Si substrate to form a nanowire film.…”
Section: Zone IV (930-1180°c)mentioning
confidence: 99%
“…1 Consequently, a great deal of effort has been made in fabricating Si-based nanostructures, especially Si nanowires. Several techniques have been developed to produce Si nanowires, including lithography and etching, [2][3][4] scanning tunneling microscopy, 5,6 vapor-liquid-solid (VLS) growth, [7][8][9][10] laser ablation of metalcontaining Si target [11][12][13][14] or metal-free Si/SiO 2 target, 11,15 and thermal evaporation of Si-SiO 2 mixture 11,16,17 or SiO powders. 11,18 Among these techniques, the thermal evaporation technique developed by Lee et al 11 is of particular interest and has attracted much attention in recent years due to its low cost and ease of manufacture.…”
Section: Introductionmentioning
confidence: 99%
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“…Actually polycrystalline silicon has a similar crystal structure and SAED pattern with interplane spacings of 3.1 and 1.9 Å corresponding to (111) and (220) lattice planes. 6 According to the Mg-Si phase diagram, the Mg 2 Si phase is stable up to >1000 o C. 7 In this context, annealing of the film at 500 o C might not cause the phase change. It is thus obvious that the isolated Si is not caused by segregation from Mg 2 Si during annealing but was already present in the film as prepared, and was undetectable by XRD.…”
Section: Resultsmentioning
confidence: 99%
“…Silicon nanowires (SiNWs) are attractive nanomaterials because of their compatibility to state-of-the-art integrated circuit technology [1,2].…”
mentioning
confidence: 99%