Defect engineering can enhance key
properties of metal–organic
frameworks (MOFs). Tailoring the distribution of defects, for example
in correlated nanodomains, requires characterization across length
scales. However, a critical nanoscale characterization gap has emerged
between the bulk diffraction techniques used to detect defect nanodomains
and the subnanometer imaging used to observe individual defects. Here,
we demonstrate that the emerging technique of scanning electron diffraction
(SED) can bridge this gap uniquely enabling both nanoscale crystallographic
analysis and the low-dose formation of multiple diffraction contrast
images for defect analysis in MOFs. We directly image defect nanodomains
in the MOF UiO-66(Hf) over an area of ca. 1000 nm and with a spatial
resolution ca. 5 nm to reveal domain morphology and distribution.
Based on these observations, we suggest possible crystal growth processes
underpinning synthetic control of defect nanodomains. We also identify
likely dislocations and small angle grain boundaries, illustrating
that SED could be a key technique in developing the potential for
engineering the distribution of defects, or “microstructure”,
in functional MOF design.