2022
DOI: 10.1007/s10854-022-09237-y
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Synthesis and optoelectronic characterization of coronene/CdO self-powered photodiode

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Cited by 9 publications
(5 citation statements)
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“…This difference can be explained by the stoichiometry, their thickness, differences in the crystal lattice systems, and differences in the particle size of the produced films. 3gives the relationship between absorbance (A) and transmittance (T) and when the multiple reflections are neglected, transmittance of the film is calculated with following equation [32]; 𝑇 = (1 − 𝑅) ! exp(−𝐴) (4) where, R refers to the reflectance and it can be defined with the relationship between transmittance and absorbance as given by [33]; 𝑅 = 1 − ( , -./ (2&)…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…This difference can be explained by the stoichiometry, their thickness, differences in the crystal lattice systems, and differences in the particle size of the produced films. 3gives the relationship between absorbance (A) and transmittance (T) and when the multiple reflections are neglected, transmittance of the film is calculated with following equation [32]; 𝑇 = (1 − 𝑅) ! exp(−𝐴) (4) where, R refers to the reflectance and it can be defined with the relationship between transmittance and absorbance as given by [33]; 𝑅 = 1 − ( , -./ (2&)…”
Section: Resultsmentioning
confidence: 99%
“…versus ℎ𝜐 graphs of the CdSe and CdS thin films. 𝐴 = −𝑙𝑜𝑔𝑇 (3) Equation3gives the relationship between absorbance (A) and transmittance (T) and when the multiple reflections are neglected, transmittance of the film is calculated with following equation[32]; 𝑇 = (1 − 𝑅) ! exp(−𝐴) (4) where, R refers to the reflectance and it can be defined with the relationship between transmittance and absorbance as given by[33]; 𝑅 = 1 − (…”
mentioning
confidence: 99%
“…Notably, the forward and reverse currents of the photodiode were approximately the same under the various light intensities. In addition, a nonsaturation state was observed under reverse bias under both dark and light intensities, which may be explained by the decrease in barrier height due to image force and interface states [55,56]. As the voltage in reverse bias increased, carriers began to accumulate between the contact and the active layer, leading to a decrease in barrier height.…”
Section: Electrical Analysis Of the Ag/mnpc/gc/ag Photodiodementioning
confidence: 98%
“…Double logarithmic I-V graphs of the Ag/MnPc/GC/Ag photodiode for the dark environment and light intensities of 20-100 mW.cm −2 are given in figures 7(a)-(f). Figure 7(a) shows that there are four distinct regions in the dark environment: ohmic, space-charge-limited current (SCLC), trap filling limit (TFL), and trap-free SCLC [55,67,68]. Region I, with a gradient of 0.26, is the low voltage region and the current rises slowly due to the density of the effective carrier being lower than the density of the thermal carrier, where the ohmic mechanism can be associated with the distribution of the trap centres [69].…”
Section: Electrical Analysis Of the Ag/mnpc/gc/ag Photodiodementioning
confidence: 99%
“…Figure 2: a) Absorption coefficient versus wavelength and b) (𝛼ℎ𝑣) # versus ℎ𝑣 graphs of the CdCuO andZnCuO composite thin films. The extinction coefficient (k) and refractive index (n) values of CdCuO and ZnCuO composite thin films are calculated with equation 5 and 6 using the relationship with the absorption coefficient (α)[25,26] and are demonstrated in Figure3.…”
mentioning
confidence: 99%