Objectives: The aim of this work is to fabricate and analyze the Aluminum Doped ZnO, Copper Oxide CuO and their heterojunction CuO/ZnO:Al using Spin Coating and Rf-Sputtering techniques. Methods: ZnO:Al was synthesized from a sol-gel precursor and deposited on Indium Tin Oxide-coated glass substrate ITO using spin coating. CuO thin films, on the other hand, were elaborated by RF-sputtering. The characterization of both thin films was performed by means of X-ray diffraction, scanning electron microscopy and UV-visible-NIR double beam spectrophotometer. The CuO/ZnO:Al heterojunction was fabricated and characterized using current voltage, capacitance-voltage and conductancevoltage measurements. Findings: The collected results confirm the rectifying nature of the junction with a built-in voltage V bi of about 1.6 V.