2009
DOI: 10.1016/j.tsf.2008.12.047
|View full text |Cite
|
Sign up to set email alerts
|

Synthesis and characterization of Nb2AlC thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
31
0
1

Year Published

2010
2010
2024
2024

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 53 publications
(34 citation statements)
references
References 18 publications
2
31
0
1
Order By: Relevance
“…[275]. Very recently, Scabarozi et al [109] reported that epitaxial Nb 2 AlC thin films exhibit a superconducting transition at 440 mK. Further, theoretical studies have suggested that superconducting MAX phases should primarily be found among those whose corresponding MX phases are superconductors [298].…”
Section: Superconductivitymentioning
confidence: 99%
See 1 more Smart Citation
“…[275]. Very recently, Scabarozi et al [109] reported that epitaxial Nb 2 AlC thin films exhibit a superconducting transition at 440 mK. Further, theoretical studies have suggested that superconducting MAX phases should primarily be found among those whose corresponding MX phases are superconductors [298].…”
Section: Superconductivitymentioning
confidence: 99%
“…These observations seem contradictory to the strong anisotropy predicted by theory for many MAX phases, and this is yet another indication that any connection between the band structure and the conductivity must be made with great care. Furthermore, some experimental studies actually suggest that the c-axis conductivity for Ti 2 GeC [282], Nb 2 AlC [109], and Ti 2 AlN [283] might be higher than the in-plane conductivity. This suggestion could very well be correct (cf., section 6.1.3), but is nevertheless counterintuitive and in apparent contradiction to the theoretical band structure.…”
Section: Ti 2 Aln [281]mentioning
confidence: 99%
“…However, some of these do not investigate phase-pure samples, 51,52 and in those cases, any differences observed between bulk resistivity and measured resistivities for thin films can be explained by large amounts of secondary phases rather than by anisotropy. Scabarozi et al 25 performed measurements on phase-pure, high-quality epitaxial (000 )-oriented Ti 2 GeC, and a comparison with bulk polycrystalline samples suggested that the anisotropy in the conductivity is relatively weak (a factor of 1.6 between c-axis conductivity and in-plane conductivity).…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…Numerous other MAX phase materials have been deposited using magnetron sputtering [7][8][9][10][11][12][13][14] including Cr 2 AlC [15][16][17][18][19][20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%