Synthesis and Characterization of Eu₂InTe₅: A New Layered Multitelluride and Its Thermoelectric Properties

Abstract

The new layered Eu2InTe5 single crystals are grown via the self flux approach. The single‐crystal X‐ray diffraction analysis reveals that this new material has a crystallographic structure in the tetragonal structure with space group I4/mmm (no. 139) and cell parameters a = b = 4.5981(2) Å, c = 24.302(3) Å. The electrical resistivity and Hall effect measurements demonstrate a “bad metal” with a low charge carrier concentration. The thermoelectric analysis gives the values of the thermopower and the figure of merit at room temperature ≈270 μV K−1 and ≈0.1, respectively, making Eu2InTe5 and its derivatives promising for thermoelectric applications.