2019
DOI: 10.30799/jnst.243.19050405
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Synthesis and Characterization of Chemically Deposited Nickel Sulphide Thin Film Electrodes for Electrochemical Supercapacitor Application

Abstract: Nickel sulphide (NiS) thin films were synthesized on glass and stainless steel (SS) substrates using a simple chemical bath deposition route. The structural, surface morphology were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM) respectively. The electrochemical capacitor performances were examined by using cyclic voltammetry, galvanostatic charge-discharge test and electrochemical impedance spectroscopy. In cyclic voltammetry (CV) studies, the NiS electrode exhibits the specif… Show more

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Cited by 2 publications
(1 citation statement)
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“…Anuar Kasim et al deposited NiS films on glass substrates using the CBD method and the influence of triethanolamine on the structural and morphological properties was studied (12) . Sonawane et al prepared NiS films on glass and stainless steel substrates using the CBD method at room temperature and investigated the electrochemical supercapacitor application (13) . Paresh Gaikar et al (14) prepared NiS thin films on titanium substrate with additive free by using the chemical bath deposition method for pseudocapacitor application, where the XRD pattern showed polycrystalline nature having a crystalline size of 19 nm.…”
Section: Introductionmentioning
confidence: 99%
“…Anuar Kasim et al deposited NiS films on glass substrates using the CBD method and the influence of triethanolamine on the structural and morphological properties was studied (12) . Sonawane et al prepared NiS films on glass and stainless steel substrates using the CBD method at room temperature and investigated the electrochemical supercapacitor application (13) . Paresh Gaikar et al (14) prepared NiS thin films on titanium substrate with additive free by using the chemical bath deposition method for pseudocapacitor application, where the XRD pattern showed polycrystalline nature having a crystalline size of 19 nm.…”
Section: Introductionmentioning
confidence: 99%