Synchrotron X‐Ray Scanning Tunneling Microscopy: Fingerprinting Near to Far Field Transitions on Cu(111) Induced by Synchrotron Radiation

Rose, Volker; Wang, Kangkang; Chien, TeYu; Hiller, Jon; Rosenmann, Daniel; Freeland, J. W.; Preissner, Curt; Hla, Saw‐Wai

doi:10.1002/adfm.201203431

Cited by 27 publications

(28 citation statements)

References 23 publications

(24 reference statements)

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“…When the sample is illuminated by synchrotron X-rays, photoelectrons can be generated [14]. Because photoejected electrons from the sample can interfere with the conventional tunneling conditions of the STM [15], a nanofabricated "smart tip" was utilized, covered with layers of insulating and conductive coatings [12]. The smart tip focuses electron detection solely near the apex region of the scanning tip where the main interaction with the sample occurs, minimizing the background electrons collected at the sidewalls of the tip [16,17].…”

Section: Methodsmentioning

confidence: 99%

Hard X-ray beam damage study of monolayer Ni islands using SX-STM

et al. 2015

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X-ray beam-induced damage in nanoscale metal islands was investigated. Monolayer-high Ni islands were prepared on a Cu(111) substrate. High brilliance X-rays with photon energies between 8.45 and 8.85 keV illuminated the sample for about 11 hours. In order to track changes in the morphology of the islands, the synchrotron X-ray scanning tunneling microscopy (SX-STM) technique was utilized. The result shows that X-ray illumination onto Ni islands does not induce noticeable damage. The study demonstrates that local beam-induced changes can be studied using SX-STM.

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Section: Methodsmentioning

confidence: 99%

Hard X-ray beam damage study of monolayer Ni islands using SX-STM

et al. 2015

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“…However, W oxidizes easily during the fabrication process therefore chemically inert PtIr tips have been developed. Different approaches have been used to coat PtIr tips, which include boron nitride deposition (BN) or SiO 2 by e-beam deposition [7,12,13]. In the section below we review various approaches that have been developed and applied to fabrication of smart tips in the past five years [4,[14][15][16][17][18]].…”

Section: Smart Tipsmentioning

confidence: 99%

X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3

et al. 2019

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Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along with ultra-high resolution imaging by SX-STM can be realized through excitation of core electrons by incident X-rays when their energy is tuned to an absorption edge of a particular atom during raster scanning, as is done in the conventional STM experiments. In this work, we provide a brief summary and the current status of SX-STM and discuss its applications for material science. In particular, we discuss instrumentation challenges associated with the SX-STM technique and present early experiments on Cu doped ZrTe3 single crystals.

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“…Scanning tunneling microscopy (STM), in particular its spin polarized version (SP-STM) has shown to be able to image spin systems with atomic resolution [9]. Combining STMs and SP-STMs with the chemical and magnetic contrast with polarized x-rays from synchrotrons has the exciting perspective to study novel materials in a completely new ways [77]. Fig.…”

Section: Synchrotron X-ray Scanning Tunneling Microscopymentioning

confidence: 99%

Magnetic imaging with polarized soft x-rays

Fischer

2017

J. Phys. D: Appl. Phys.

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Properties, behavior, and functionalities of magnetic materials are largely determined by microscopic spin textures, particularly their formation into domains, their coupling mechanisms and their dynamic behavior. Advanced characterization tools are prerequisite to fundamentally understand magnetic materials and control spins for novel magnetic applications. Magnetic microscopies allow to image directly the static and dynamic features of the relevant microscopic magnetization structures in advanced magnetic materials and thus provide detailed and direct insight into underlying physical phenomena. A large variety of magnetic imaging techniques has become available with particular strengths but also certain limitations.Essential features of magnetic microscopies are a high spatial resolution down into the nanometer regime, as this is the fundamental length scale of magnetic exchange interaction and the ultimate length scale in advanced magnetic technologies; magnetic and elemental sensitivity with quantitative capabilities, as the properties of advanced magnetic materials can be tailored by combining various magnetic elements and their magnetic moments; high temporal resolution from the nsec to the fsec regime to understand the associated spin dynamic processes and the functionality in magnetic devices; tomographic capabilities with nm resolution as new directions in nanoscience and technologies are moving into 3dim arrangements of spin structures; and interfacial sensitivity as novel ways to control spins harness either the coupling across interfaces in multilayered structures or utilize non-collinear spin arrangements, which often occur from symmetry breaking at surfaces and interfaces.The unique properties of polarized soft x-rays, their abundancy and specific interaction with magnetic materials in form of dichroism effects have triggered the development of various magnetic x-ray imaging techniques. This review will provide an overview of the current state-of-the-art in magnetic imaging with polarized soft x-rays. It describes the various approaches using x-ray optics, electron optics and diffraction based techniques and it will highlight the capabilities of each technique by selected examples from current research.

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Synchrotron X‐Ray Scanning Tunneling Microscopy: Fingerprinting Near to Far Field Transitions on Cu(111) Induced by Synchrotron Radiation

Cited by 27 publications

References 23 publications

Hard X-ray beam damage study of monolayer Ni islands using SX-STM

Hard X-ray beam damage study of monolayer Ni islands using SX-STM

X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3

Magnetic imaging with polarized soft x-rays

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