2005
DOI: 10.2516/ogst:2005069
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Synchrotron X-Ray Microfluorescence and Microspectroscopy: Application and Perspectives in Materials Science

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Cited by 4 publications
(1 citation statement)
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“…μ-XRF spectrometers that make use of synchrotron radiation are described in section 6. The capabilities of scanning XRF microscopes using synchrotron radiation are not limited to elemental microanalysis but can be combined with transmission μ-XAS (Bohic et al 2005, Ade and Hitchcock 2008, Cotte et al 2010, Jacobsen et al 2003, Zhang et al 1994, Urquhart and Ade 2002 and 3D imaging (Rau et al 2001. In some instruments, simultaneous monitoring of absorption, phase contrast and darkfield imaging is implemented as well (Hornberger et al 2007, Stampanoni et al 2006.…”
Section: Scanning X-ray Microscopesmentioning
confidence: 99%
“…μ-XRF spectrometers that make use of synchrotron radiation are described in section 6. The capabilities of scanning XRF microscopes using synchrotron radiation are not limited to elemental microanalysis but can be combined with transmission μ-XAS (Bohic et al 2005, Ade and Hitchcock 2008, Cotte et al 2010, Jacobsen et al 2003, Zhang et al 1994, Urquhart and Ade 2002 and 3D imaging (Rau et al 2001. In some instruments, simultaneous monitoring of absorption, phase contrast and darkfield imaging is implemented as well (Hornberger et al 2007, Stampanoni et al 2006.…”
Section: Scanning X-ray Microscopesmentioning
confidence: 99%