1989
DOI: 10.1002/pol.1989.140280703
|View full text |Cite
|
Sign up to set email alerts
|

Synchrotron X-ray diffraction of a single filament and a bundle of poly (p-phenylene terephthalamide) filaments

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
3
0

Year Published

1991
1991
2024
2024

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 8 publications
(3 citation statements)
references
References 10 publications
0
3
0
Order By: Relevance
“…The use of synchrotron radiation microbeam of a high brightness has enabled WAXD characterization of individual fibers with sufficient diffraction intensity. For instance, Chu et al employed this method to investigate the lattice deformation of single PPTA fibers under tensile stress . Li et al studied the structural evolution of PPTA fibers during stretching and found that the amorphous phase can transform into a crystalline phase at high strains .…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The use of synchrotron radiation microbeam of a high brightness has enabled WAXD characterization of individual fibers with sufficient diffraction intensity. For instance, Chu et al employed this method to investigate the lattice deformation of single PPTA fibers under tensile stress . Li et al studied the structural evolution of PPTA fibers during stretching and found that the amorphous phase can transform into a crystalline phase at high strains .…”
Section: Introductionmentioning
confidence: 99%
“…The use of synchrotron radiation microbeam of a high brightness has enabled WAXD characterization of individual fibers with employed this method to investigate the lattice deformation of single PPTA fibers under tensile stress. 9 Li et al studied the structural evolution of PPTA fibers during stretching and found that the amorphous phase can transform into a crystalline phase at high strains. 10 However, such experiments require a high-energy light source provided by a synchrotron facility and are not suitable for routine research.…”
Section: ■ Introductionmentioning
confidence: 99%
“…Chu et al detected the lattice deformation of PPTA single fiber under tensile stress using a synchrotron wide-angle X-ray diffraction method. [18][19][20] However, they reported only equatorial 200 and 110 reflection shifts, which correspond to the lattice deformation in the direction perpendicular to the chain axis and tensile stress. Davies et al measured the lattice deformation from meridional layer lines of PPTA single fiber using a microfocus X-ray diffraction technique.…”
mentioning
confidence: 99%