2021
DOI: 10.1063/5.0053291
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Synchrotron studies of functional interfaces and the state of the art: A perspective

Abstract: The dramatic improvements in synchrotron light sources across the world imply tremendous opportunities for interface science. In this Perspective, we describe a variety of current scattering and spectroscopic techniques with an eye toward how these will evolve, particularly with the advent of diffraction-limited sources. We also note the importance of in situ and operando methods for both understanding interface creation and interface evolution in different environments. As interfaces are often where critical … Show more

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Cited by 5 publications
(6 citation statements)
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“…High intensity synchrotron x-rays with photon energies above 20 keV can penetrate through the thick reactor walls required to shield high temperature and low pressure growth processes in purpose-built XRD-compatible synthesis chambers. This has been demonstrated for several synthesis approaches relevant for SiC [67] (figure 2(a)), including in a growth reactor for nitride CVD [91]. While the phase space of nitride CVD differs from that of SiC both in terms of the chemistry and relevant growth temperatures ( 1200 • C), work on GaN [91][92][93][94] serves as a proof-of-concept framework for future in situ studies of SiC growth.…”
Section: General Principles and Sic Contextmentioning
confidence: 92%
See 1 more Smart Citation
“…High intensity synchrotron x-rays with photon energies above 20 keV can penetrate through the thick reactor walls required to shield high temperature and low pressure growth processes in purpose-built XRD-compatible synthesis chambers. This has been demonstrated for several synthesis approaches relevant for SiC [67] (figure 2(a)), including in a growth reactor for nitride CVD [91]. While the phase space of nitride CVD differs from that of SiC both in terms of the chemistry and relevant growth temperatures ( 1200 • C), work on GaN [91][92][93][94] serves as a proof-of-concept framework for future in situ studies of SiC growth.…”
Section: General Principles and Sic Contextmentioning
confidence: 92%
“…The conditions required to synthesize SiC, namely temperatures in excess of ∼ 1400 • C for CVD and 2000 • C for PVT [21], are the most significant barrier precluding the direct characterization of relevant thermodynamic and kinetic factors. Fortunately, novel synthesis reactor designs compatible with high energy synchrotron x-ray characterization (E > 20 keV) have been developed and used to probe various surface processes in real time [67]. These in situ x-ray capabilities have yet to be applied to SiC synthesis but have the potential to revolutionize our understanding of polytype control.…”
Section: Introductionmentioning
confidence: 99%
“…Check for updates Zeyuan Li 1,2 , Thomas Flynn 3 , Tongchao Liu 4 , Sizhan Liu 5 , Wah-Keat Lee 1 , Ming Tang 2 & Mingyuan Ge 1 Improving the spatial and spectral resolution of 2D X-ray near-edge absorption structure (XANES) has been a decade-long pursuit to probe local chemical reactions at the nanoscale. However, the poor signal-to-noise ratio in the measured images poses significant challenges in quantitative analysis, especially when the element of interest is at a low concentration.…”
Section: Highly Sensitive 2d X-ray Absorption Spectroscopy Via Physic...mentioning
confidence: 99%
“…5 In situ and operando methods are important for understanding interface creation and interface evolution in different environments. 6 Related to this new class of ARPES experiments is the electronic response on mechanical strain as visible in the stunning changes of the electronic structure in twisted graphene. 7 Observation of XPD dates back to the pioneering work of Siegbahn et al 8 and Fadley and co-workers.…”
Section: Introductionmentioning
confidence: 99%