2002
DOI: 10.1557/jmr.2002.0391
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Synchrotron radiography and x-ray topography studies of hexagonal habitus SiC bulk crystals

Abstract: Phase-sensitive synchrotron radiation (SR) radiography was combined with x-ray diffraction topography to study structural defects of SiC crystals. The particular bulk SiC crystals examined had a low micropipe density and a hexagonal habitus composed of prismatic, pyramidal, and basal faces well developed. X-ray diffraction topography images of the sliced (0001) wafers, which were formed due to the complex lattice distortions associated with defective boundaries, demonstrated the existence of two-dimensional de… Show more

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Cited by 13 publications
(19 citation statements)
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“…Such a motion realized through the shear step formation has been observed [19,25,26,44] and modelled [25,26,44] using different experimental techniques and theoretical approaches. The lateral pipe motion results from the pipe ramification [25] or occurs due to the pipe interaction with each other, polytype boundaries and other defects.…”
Section: Discussionmentioning
confidence: 99%
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“…Such a motion realized through the shear step formation has been observed [19,25,26,44] and modelled [25,26,44] using different experimental techniques and theoretical approaches. The lateral pipe motion results from the pipe ramification [25] or occurs due to the pipe interaction with each other, polytype boundaries and other defects.…”
Section: Discussionmentioning
confidence: 99%
“…This yields:q q 2 ðkÞ ¼ Àð2=pÞ Sðk;ã aÞq q 1 ðkÞ, whereq q 1 ðkÞ is given by (19). After calculation ofq q 2 ðkÞ, the stress field s ð3Þ ij is cast from formula (38) using the Fourier transform method in the same way as the stress field s…”
Section: Pipe With Several Stepsmentioning
confidence: 99%
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