2001
DOI: 10.1063/1.1395408
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Synchrotron radiation total reflection for rainwater analysis

Abstract: Abstract. In this work Total Reflection X-Ray Fluorescence Analysis with excitation by Synchrotron Radiation (SR-TXRF) has been used for rainwater trace element analysis. The samples were collected in four different sites at Campinas City, SP, Brazil. Rainwater samples of 10 jal were added to Perspex reflector disks, dried under vacuum and analyzed for 100 s measuring time For the calibration system standard solutions with gallium as internal standard were prepared.. The detection limits obtained for K-shell l… Show more

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Cited by 6 publications
(7 citation statements)
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“…The sensitivity limit was predicted to be at the level of nanograms, which was later confirmed by Aiginger & Wobrauschek [37]. The same technique was later applied for the trace elemental analysis of solids [38] and impurities in liquids [39] with minimal sample amounts. The field of trace analysis using fluorescence under total x-ray reflection has been reviewed by von Bohlen [40] and by Klockenkämper [41].…”
Section: Materials On Solid Surfacesmentioning
confidence: 94%
“…The sensitivity limit was predicted to be at the level of nanograms, which was later confirmed by Aiginger & Wobrauschek [37]. The same technique was later applied for the trace elemental analysis of solids [38] and impurities in liquids [39] with minimal sample amounts. The field of trace analysis using fluorescence under total x-ray reflection has been reviewed by von Bohlen [40] and by Klockenkämper [41].…”
Section: Materials On Solid Surfacesmentioning
confidence: 94%
“…Метод РФА ПВО нашёл применение при ана-лизе разных вод: питьевых [16, [66][67][68][69][70][71][72][73][74][75][76][77][78][79], минеральных [71,[79][80][81][82], дождевых [69,71,[83][84][85][86][87][88][89][90][91][92][93][94] Чаще методом РФА ПВО определяют S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Br, Rb, Sr, Mo, Cd, Ba, Hg, Pb, U и др. Определение химических форм элементов возможно, например, при сочетании РФА ПВО и предварительного концентрирования (BrO 3 - [72], ClO 4 - [73], Cr(III) и Cr(IV) [74], Hg (неорг.)…”
Section: объекты анализаunclassified
“…[6] EXPERIMENTAL Instrumentation All of the measurements were made using an X-Ray Fluorescence Beamline system ( Figure 1) at the Synchrotron Light Source Laboratory, in Campinas, SP, Brazil. [7] A Si(Li) semiconductor detector (165 eV, 5.9 keV), with 8 mm beryllium window thickness, 30 mm 2 active area, coupled to an amplifier module and a multi channel analyzer, inserted in a microcomputer was used. For the sample excitation, a white beam of synchrotron radiation under total reflection condition was used, as can be seen in Figure 2.…”
Section: Introductionmentioning
confidence: 99%