Synchrotron Radiation

Abstract

This is not a treatise on small angle scattering; it is a presentation of the application of small angle scattering and the potentialities of synchrotron sources where conventional sources prove limited. A brief introduction describing the technique aims to provide the reader with no more than the qualitative tools necessary to understanding the case studies discussed further on. For a more thorough discussion, the reader is referred to standard texts in the field.

Benchmark Calculations of K-Edge Ionization Energies for First-Row Elements Using Scalar-Relativistic Core–Valence-Separated Equation-of-Motion Coupled-Cluster Methods

“…X-ray spectroscopy is widely used for probing electronic structure and dynamics in molecules, solid state, and biological systems. − In particular, recent advancements in short-pulse X-ray light sources including synchrotrons, free-electron lasers, and those based on high-harmonic generation − have enabled the study of ultrafast nuclear and electronic dynamics. − Extensive studies of computational techniques aiming at accurate calculations of X-ray photoelectron and absorption spectra are available in the literature. , The computational techniques can be classified into two broad categories. The ones in the first category perform separate orbital optimizations for core-ionized or excited states.…”

Superluminal Synchrotron Radiation

“…Relativistic electrons rotating in a magnetic field produce SR. The spectral SR energy emitted by one electron can be calculated as follows [9][10][11][12][13] (1)…”

“…The size of one spot is S=(ρ 0 /γ 3 )(ρ 0 √ δ/γ), where parameter δ depends on distance of particle to the wall. As the electric field in this area was directed along the radius, i.e., perpendicular to the wall surface, (11) and (12) could be used for field calculations. For a wall with ideal conductivity, the induced charge is calculated as:…”

Exploring high-throughput synchrotron X-Ray powder diffraction for the structural analysis of pharmaceuticals

“…The development of X-ray diffraction laboratory equipment that can easily and routinely obtain suitable diffraction patterns from powders has greatly contributed to its popularity and widespread use in research and industry. In the past two decades, the development of advanced instrumentation ( Bergamaschi et al, 2010 ; Abdellatief et al, 2022 ; Dejoie et al, 2018 ; Vanmeert et al, 2018 ; Thomae et al, 2019 ; Artioli et al, 2015 ; Vaughan et al, 2020 ) and methodologies ( Halasz et al, 2013a ; Spiliopoulou et al, 2021 ; Newman et al, 2015 ) as well as software development ( Juhas et al, 2013 ; Degen et al, 2014 ; Toby and Von Dreele, 2013 ; Coelho et al, 2011 ; Petříček et al, 2014 ; Filik et al, 2017 ) and database content ( Gates-Rector and Blanton, 2019 ) has dramatically changed the impact of XRPD in science ( Jenkins, 2001 ), and XRPD is no longer just a technique for routine assessments, but a powerful tool for the structural and microstructural analysis of materials. Initially addressing polycrystalline materials only, XRPD analytical applications also extended to the study of poorly crystalline and non-crystalline materials with the application of so-called total scattering techniques (e.g.…”