Synchrotron-based ambient pressure X-ray photoelectron spectroscopy of hydrogen and helium

Zhong, Jiuping; Wang, Mengen; Hoffmann, William H.; Spronsen, Matthijs A. van; Lu, Deyu; Boscoboinik, J. Anibal

doi:10.1063/1.5022479

Cited by 16 publications

(11 citation statements)

References 34 publications

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“…The spectra are dominated by the rich d-band structure of the Pt surface, but, when the surface is exposed to H 2 , new features appear at binding energies of 11.9 and 9.3 eV on the spectrum as indicated by the vertical lines. These features are at very similar binding energies as those observed by Zhong et al (2018) and attributed as Pt-H bonds, indicating adsorbed hydrogen. It should be noted that, since our measurement was made at much lower photon energy than that of Zhong et al, we see a much stronger signal due to the higher photoionization cross section.…”

Section: Apxps Of Hydrogen On Platinum Surfacesupporting

confidence: 69%

Upgrade of the SPECIES beamline at the MAX IV Laboratory

Kokkonen¹,

Silva²,

Mikkelã³

et al. 2021

J Synchrotron Radiat

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The SPECIES beamline has been transferred to the new 1.5 GeV storage ring at the MAX IV Laboratory. Several improvements have been made to the beamline and its endstations during the transfer. Together the Ambient Pressure X-ray Photoelectron Spectroscopy and Resonant Inelastic X-ray Scattering endstations are capable of conducting photoelectron spectroscopy in elevated pressure regimes with enhanced time-resolution and flux and X-ray scattering experiments with improved resolution and flux. Both endstations offer a unique capability for experiments at low photon energies in the vacuum ultraviolet and soft X-ray range. In this paper, the upgrades on the endstations and current performance of the beamline are reported.

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Section: Apxps Of Hydrogen On Platinum Surfacesupporting

confidence: 69%

Upgrade of the SPECIES beamline at the MAX IV Laboratory

Kokkonen¹,

Silva²,

Mikkelã³

et al. 2021

J Synchrotron Radiat

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“…Peaks emerge in the spectrum from atoms emitting electrons of a specific characteristic energy. The energies of the photoelectron peaks allow the identification and quantification of all surface elements (hydrogen and helium were once thought to be exceptions to this rule, but recent research has shown that they may be measured in XPS spectra (Zhong et al, 2018). The spectroscopy results are typically the measurements of the elemental composition and electron activity within the surface (1-10 nm) of a material (Thermo Scientific XPS, 2020):…”

Section: Introductionmentioning

confidence: 99%

XPS Studies of the SiO₂ Substrates and Thermoelectric Thin Films of Sn/Sn+SnO₂ under the Effects of the Different Thermal Treatments

Drabo¹,

Budak²,

Egarievwe³

et al. 2021

American Journal of Engineering and Applied Sciences

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Multilayered thermoelectric Sn/Sn+SnO2 thin films were prepared using KJL DC/RF magnetron sputtering system under Ar gas plasma on the SiO2 substrates. The thicknesses of the fabricated thin films were found using Filmetrics UV thickness measurement system. The fabricated thin films were annealed at different temperatures for one hour to tailor the thermoelectric properties. In this study, unannealed, annealed at 150 and 300C samples were characterized using Thermo Fisher XPS system brought to the Alabama A&M University by the NSF-MRI support. X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) is a type of analysis used for characterization of various surface materials. XPS is mostly known for the characterization of thin filmswhich are coatings that have been deposited onto a substrate and may be comprised of many different materials to alter or enhance the substrate's performance. XPS analysis provides information for composition, chemical states, depth profile, imaging and thickness of thin film. This paper focuses on the application of XPS techniques in thin film research for Sn/Sn+SnO2 multilayered thermoelectric system and SiO2 substrates annealed at different temperatures. Since SiO2 substrates were used during the deposition of the multilayer thin films, we would like to perform detailed XPS studies on the SiO2 substrates. SiO2 substrates is being used with many researchers, this manuscript will be good reference for the researchers using SiO2 substrates. Thermal treatment of the substrates and the multilayered thin films has caused some changes of the XPS characterization including binding energy, depth profile, peak value and FWHM. The treatment effects were discussed and compared to each other.

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“…x-ray photoelectron spectroscopy [10], and multiphoton processes have been detected in helium at photon energies of 42.8 and 38.4 eV at the FEL facility FLASH (Germany) [11]. FELs operating at high intensities open the way to pursue these investigations in x-ray regime.…”

Section: Introductionmentioning

confidence: 99%

“…3). This broadening is due to the slow numerical convergence of the TDSE-FULL calculations with l in expansion(10).…”

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confidence: 99%

Nondipole effects in helium ionization by intense soft x-ray laser pulses

Bachau

Dieng

2019

Eur. Phys. J. D

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We consider the helium atom exposed to laser pulses in soft-x regime at intensities of the order of 10 17 − 10 20 W/cm 2. Two cases are investigated, first a pulse with a central frequency of 20 a.u. (∼ 544.2 eV) and a pulse with a central frequeny of 50 a.u. (∼ 1.36 keV). We solve the time-dependent Schrödinger equation (TDSE), nondipole (retardation) effects are included up to O(1/c) (c being the velocity of light). We study the single photoionization of helium with a focus on nondipole effects. We calculate the total and partial photoelectron energy spectra, and the photoelectron angular distributions. The nondipole effects associated with the A • P and A 2 coupling terms in the Hamiltonian (A denoting the vector potential of the field and P the momentum operator) are thoroughly analyzed in the region of one-photon resonance. We show that the nondipole contribution associated with A • P varies linearly with the intensity I while a three-photon transition involving A 2 increases like I 3 , in agreement with lowest order perturbation theory (LOPT). At high intensities these contributions compete and the nondipole transition becomes nonlinear. The physical mechanisms associated with nondipole couplings are discussed, as well as their effects on photoelectron energy and angular distributions. PACS. PACS-key discribing text of that key-PACS-key discribing text of that key

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Synchrotron-based ambient pressure X-ray photoelectron spectroscopy of hydrogen and helium

Cited by 16 publications

References 34 publications

Upgrade of the SPECIES beamline at the MAX IV Laboratory

Upgrade of the SPECIES beamline at the MAX IV Laboratory

XPS Studies of the SiO₂ Substrates and Thermoelectric Thin Films of Sn/Sn+SnO₂ under the Effects of the Different Thermal Treatments

Nondipole effects in helium ionization by intense soft x-ray laser pulses

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Synchrotron-based ambient pressure X-ray photoelectron spectroscopy of hydrogen and helium

Cited by 16 publications

References 34 publications

Upgrade of the SPECIES beamline at the MAX IV Laboratory

Upgrade of the SPECIES beamline at the MAX IV Laboratory

XPS Studies of the SiO2 Substrates and Thermoelectric Thin Films of Sn/Sn+SnO2 under the Effects of the Different Thermal Treatments

Nondipole effects in helium ionization by intense soft x-ray laser pulses

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XPS Studies of the SiO₂ Substrates and Thermoelectric Thin Films of Sn/Sn+SnO₂ under the Effects of the Different Thermal Treatments