“…For our purposes, only the delay values are of interest, not the detailed waveforms. It has been generally recognize that, in CMOS structures, delay of gates can be accurately described through design parameters such as : technology, size of active components and parasitic capacitances [13,14]. We propose to extend this approach to resistive loading terms in order to accurately characterize interconnection delays, differentiating purely capacitive from mixed resistive and capacitive contributions.…”