2011
DOI: 10.1088/0268-1242/27/1/015006
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Symmetrical current–voltage characteristic of a metal–semiconductor–metal structure of Schottky contacts and parameter retrieval of a CdTe structure

Abstract: Symmetrical, non-linear and current-voltage (I -V ) characteristics of a metal-semiconductormetal (M-S-M) structure of two metallic Schottky contacts fabricated to a p-type semiconductor were modeled by treating the semiconductor as a resistor sandwiched between two identical head-to-head Schottky barriers. The voltage distributions along the M-S-M structure were numerically determined and found that the voltage drop across the reverse-biased Schottky barrier is dominating at the low bias voltage, and the domi… Show more

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Cited by 46 publications
(33 citation statements)
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“…Furthermore, Elhadidy et al [32] modeled the symmetrical, non-linear current to voltage characteristics of a metal-semiconductor-metal structure of two metallic Schottky contacts fabricated to a p-type semiconductor by treating the semiconductor as a resistor sandwiched between two identical head-to-head Schottky barriers. Each one of the two Schottky barriers is modeled as a sub-circuit consisting of a diode in parallel to a resistor.…”
Section: Equivalent Circuits For Matching Experimental Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Furthermore, Elhadidy et al [32] modeled the symmetrical, non-linear current to voltage characteristics of a metal-semiconductor-metal structure of two metallic Schottky contacts fabricated to a p-type semiconductor by treating the semiconductor as a resistor sandwiched between two identical head-to-head Schottky barriers. Each one of the two Schottky barriers is modeled as a sub-circuit consisting of a diode in parallel to a resistor.…”
Section: Equivalent Circuits For Matching Experimental Resultsmentioning
confidence: 99%
“…In the present work an equivalent circuit model is developed by following the concept introduced by Elhadidy et al [32] consisting of a memristor sandwiched between two identical head-to-head Schottky barriers. The Schottky barriers are represented by sub-circuits consisting of a diode in parallel to a resistor and result to a slight modification of the memristive curve.…”
Section: Equivalent Circuits For Matching Experimental Resultsmentioning
confidence: 99%
“…For simulating the electrical response of the bare silicon nanowire devices under study, an equivalent circuit model is developed in Fig.3, taking inspiration from the concept that is introduced by Elhadidy et al [17] but consisting of a memristor sandwiched between two identical head-to-head Schottky barriers. The Schottky barriers are represented by sub-circuits consisting of a diode in parallel to a resistor and result to a slight modification of the memristive curve.…”
Section: Resultsmentioning
confidence: 99%
“…At higher voltages, the Schottky barrier between silicon and aluminium bonding pads comes into play [26]. Computation of the mean zero-bias resistance 〈R 0 〉=13.6±0.9 kΩ implies that the actual variations in h SOI remain below 7 %.…”
Section: Measurementsmentioning
confidence: 99%