Piezoresponse Force Spectroscopy (PFS) is a powerful method widely used for measuring the nanoscale ferroelectric responses of the materials. However, it is found that certain non-ferroelectric materials can also generate similar responses from the PFS measurements due to many other factors, hence, it is believed that PFS alone is not sufficient to differentiate the ferroelectric and non-ferroelectric materials. On the other hands, this work shows that there are distinct differences in contact resonance frequency variation during the PFS measurements for ferroelectric and non-ferroelectric materials.Therefore, a new, simple and effective method is proposed to differentiate the responses from the ferroelectric and non-ferroelectric materials, this new analysis uses contact resonance frequency responses during the PFS measurements as a new parameter to differentiate the PFS measured responses from 2 different materials. Development and applications of the ferroelectric materials have been one of the most active topics for decades. Due to the unique characteristics of spontaneous polarization, ferroelectric materials have been used in a wide range of applications, such as sensors, actuators and memory devices. 1 Developing new ferroelectric materials has great significances for research and applications in the area of functional materials. 2 Comparing with the common dielectric materials with a linear polarization response, ferroelectric materials demonstrate a nonlinear and nonzero polarization response. 3 To study the ferroelectric phenomena at nanoscale, such as at domain level, Piezoresponse Force Microscopy (PFM) and its spectroscopy form, Piezoresponse Force Spectroscopy (PFS), are widely used in the last decades. As the premier characterization tools for domain structures, orientation and properties of the ferroelectric materials, PFM and PFS techniques can probe time-or voltage-dependent phenomena withhigh spatial resolution. 4 In the PFS measurements, the surface of the sample contacts with a sharp conductive tip at the end of PFM cantilever. After applying excitation of DC voltage and scanning of the sample surface with the same tip, local polarization switching may occur and can be detected by the same tip. However, due to the principle of probing method in PFS, 5,6 the measurements of the local ferroelectric responses can be affected by a number of factors. Besides the polarization-electric field (P-E) relationship, the electrostatic force between the tip and sample surface, 7 surface charging, 8-10 Vegard effect 11 and ionic mechanisms 12-14 can also induce the hysteresis-like loops in which are similar to the P-E loops obtained in ferroelectric materials during the PFS measurements. In addition, it is also noted that such hysteresis-like loop can also be observed in a broad variety of non-ferroelectric materials during the PFS measurements, for example, glass, 15 LiCoO2, 12 TiO2 16 and even banana peel. 5 It was therefore believed that the hysteresis loops obtained by PFS is insufficient as the only pr...