pân junctions constructed from the group-10 TMDCs, or namely, transition metal dichalcogenides with an intrinsic layered structure, are not considerably reported. This study presents a mechanical exfoliation-based technique to prepare PtS 2 /Si pyramid pân junctions for an investigation of tunneling and breakdown diodes. The demonstrated pân diode exhibited a high rectifying performance reaching a rectification ratio (I f /I r ) of âŒ7.2 Ă 10 4 at zero gate bias with an ideality factor of âŒ1.5. The Zener tunneling was observed at a low reverse bias region of breakdown voltage (from â6 to â1.0 V) at various temperatures (50 to 300 K), and it was a negative coefficient of temperature. Conversely, for the greater breakdown voltage regime (â15 to â11 V), the breakdown voltage increased with the increased temperature (200 to 300 K), indicating a positive coefficient of temperature. Therefore, this phenomenon was attributed to the avalanche breakdown. The pân junctions displayed photovoltaic characteristics under the illumination of visible light (500 nm), such as a high responsivity (R ph ) and a photo gain (G) of 11.88 A/W and 67.10, respectively. The maximum values for both the open-circuit voltage (V OC ) and the short-circuit current (I SC ) were observed to be 0.45 V and 10 ÎŒA, respectively, at an input intensity of light of 70.32 mW/cm 2 . The outcomes of this study suggest that PtS 2 / Si pyramid pân junctions may be employed in numerous optoelectronic devices including photovoltaic cells, Zener tunneling diodes, avalanche breakdown diodes, and photodetectors.