The effect of non-ionising energy loss (NIEL) of protons in charge-coupled devices is to displace silicon atoms and any dopant materials present from their lattice positions to form lattice defects which in turn can trap electrons [1]. A CCD operating as a photon counter for x-ray spectroscopy relies on the efficient transfer of charge from one region to another. The number of defects produced will reduce the charge transfer efficiency (CTE) and hence degrade the spectral resolution of the energy distribution of interest [2]. The Swift X-ray Telescope will be equipped with a single EPIC MOS CCD22 as developed for the XMM project [3]. It is the aim of this study to determine the effect of the radiation environment on the performance of the CCD and its impact on the scientific objective of the x-ray telescope, to probe the x-ray afterglow of Gamma Ray Bursts (GRBs).Keywords: Charge-coupled device, radiation, damage, x-ray, spectroscopy, resolution. 95.55.A, 95.85.N, 07.89
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IntroductionThe Swift X-ray Telescope (XRT) is part of the Swift Gamma Ray Burst Explorer, which is a three-telescope space observatory for studying the position, brightness, and physical properties of gamma ray bursts [4,5] The XRT is a sensitive, flexible, autonomous X-ray CCD imaging spectrometer designed to measure the position, spectrum, and brightness of gamma-ray bursts (GRBs) and afterglows over a wide dynamic range covering more than seven orders of magnitude in flux [4,5]. An x-ray spectroscopy capability enables the determination of the redshift of the GRB if any spectral lines are visible in the x-ray afterglow [4,5]. The required spectral resolution is 300 eV at 6.4 keV for the three year mission lifetime [4,5].In order to accomplish this, the x-ray response of the CCD as a function of non-ionising damage must be