2018
DOI: 10.1016/j.nanoen.2018.03.068
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Sustained electron tunneling at unbiased metal-insulator-semiconductor triboelectric contacts

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Cited by 114 publications
(151 citation statements)
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“…[ 5 ] Recently, it was found that the CE will be very different when the semiconductor is involved. [ 6 ] The current can be generated by the contact or sliding of a P‐type semiconductor against an N‐type semiconductor [ 7–9 ] (or semiconductor against metal [ 10–12 ] ), and a novel electric generator was proposed. [ 7 ] This new type of electric generator is gaining attention for that a direct current can be generated without a rectifier module.…”
Section: Figurementioning
confidence: 99%
“…[ 5 ] Recently, it was found that the CE will be very different when the semiconductor is involved. [ 6 ] The current can be generated by the contact or sliding of a P‐type semiconductor against an N‐type semiconductor [ 7–9 ] (or semiconductor against metal [ 10–12 ] ), and a novel electric generator was proposed. [ 7 ] This new type of electric generator is gaining attention for that a direct current can be generated without a rectifier module.…”
Section: Figurementioning
confidence: 99%
“…[5,6] It is suggested that the decreased Φ B in a metal/semicondcuting polymer junction under compression may facilitate the electron transfer for DC generation. Accordingly, it is found that the Φ B is decreased from 0.7 to 0.62 eV under sliding condition, which is possibly due to the decreased interfacial atomic distance as will be revealed by the MD simulation result or the surface band bending induced by the localized triboelectric electric field E (as high as 10 8 V m −1 ).…”
Section: Doi: 101002/aelm201900464mentioning
confidence: 99%
“…[8] In DFT studies, intensified charge redistribution is also observed at decreased atomic distance, which is adopted to explain the enhanced electrostatic charge transfer in polymerbased TENGs. To evaluate the quality of the generator system, fill factor (FF) is adopted, which compares the maximum power P m to the theoretical power: [5,6] www.advelectronicmat.de effort should be dedicated to increasing the shunt resistance (R sh ), as well as decreasing the series resistance (R s ) and diode loss. Figure 3a shows the I and V output as a function of external resistance R. It can be seen that the V increases and the I decreases as predicted by Equations (S6) and (S7), Supporting Information.…”
Section: Doi: 101002/aelm201900464mentioning
confidence: 99%
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