Surviving state disruptions caused by test: A case study

Parker, Kenneth P.; Kameyama, Shuichi; Dubberke, David

doi:10.1109/test.2011.6139140

Cited by 3 publications

(2 citation statements)

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“…Since the last revision of the standard in 2001, the industry witnessed a drastic change in the IC technology. Many of these changes have been driven by design complexity and there are many devices available with programmable features including programmable IO behaviour [4]. Boundary scan testing put the device IOs in to test mode were their IOs are controlled by boundary register contents.…”

Section: Ieee 11491-2013 Revisionmentioning

confidence: 99%

“…The standard uses instructions like EXTEST and CLAMP for this. When the non-test instructions like BYPASS or IDCODE is encountered between the test mode instruction the TAP pass through TLR state and IO pins are revert back to functional mode [4]. These switching events are completely unsynchronised with current activities in the board, so that the internal logic of each IC may see completely illogical states [3].…”

Section: Ieee 11491-2013 Revisionmentioning

confidence: 99%

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Design of IEEE 1149.1 Tap Controller IP Core

Shelja¹,

Nandakumar²,

Muruganantham³

2016

Computer Science &Amp; Information Technology ( CS &Amp; IT )

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An implementation of IEEE 1149.1 TAP controller is presented in this paper. JTAG is an established technology and industry standard for on-chip boundary scan testing of SoCs. JTAG TAP controllers are becoming a delivery and control mechanism for Design For Test. The objective of this work is to design and implement a TAP controller IP core compatible with IEEE 1149.1-2013 revision of the standard. The test logic architecture also includes the Test Mode Persistence controller and its associated logic. This work is expected to serve as a ready to use module that can be directly inserted in to a new digital IC designs with little modifications.

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Section: Ieee 11491-2013 Revisionmentioning

confidence: 99%

Section: Ieee 11491-2013 Revisionmentioning

confidence: 99%