2014
DOI: 10.1109/tvlsi.2013.2252473
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Survey and Analysis of Delay-Locked Loops Used in DRAM Interfaces

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Cited by 12 publications
(1 citation statement)
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“…Because tAC is a function of process, voltage, and temperature (PVT), READ data availability at the memory-control unit (MCU) exhibits both static and dynamic variability. When the MCU attempts to capture all incoming data bits simultaneously, the valid data window disappears and causes a failure to capture the data without DLL for removing the tAC variation, as described in Figure 3; the conceptual block diagram of clocking with DLL is shown in Figure 4 [6], [7].…”
Section: Past Challenges and Innovations: The First Turning Pointmentioning
confidence: 99%
“…Because tAC is a function of process, voltage, and temperature (PVT), READ data availability at the memory-control unit (MCU) exhibits both static and dynamic variability. When the MCU attempts to capture all incoming data bits simultaneously, the valid data window disappears and causes a failure to capture the data without DLL for removing the tAC variation, as described in Figure 3; the conceptual block diagram of clocking with DLL is shown in Figure 4 [6], [7].…”
Section: Past Challenges and Innovations: The First Turning Pointmentioning
confidence: 99%