Surface Wave Technique at Millimeter Waveband for Semiconductor Testing by Photoexcitation

Numerical‐analytical method for determining the dielectric constant of 1D inhomogeneous plate in a waveguide

“…There exist various methods of electromagnetic‐wave non‐destructive testing, such as tomography, reflectometry, ellipsometry and so on. [8–13]. All of them require solving inverse diffraction problem that allows determining physical parameters of materials under study by the measured characteristics of the diffraction field.…”