A novel buffer layer consists of titanium oxide grown on a-sapphire by low-pressure chemical vapor deposition using titanum-tetra-iso-propoxide and oxygen gas was used for ZnO epitaxial growth at temperature as low as 340˚C by plasma-assisted epitaxy using radio-frequency oxygen-gas plasma. XRD and RHEED indicated (0001)Ti 2 O 3 layer in corundum crystal system was epitaxially grown on the substrate in an in-plane relationship of [1-100]Ti 2 O 3 // [0001]Al 2 O 3 by uniaxial phase-lock system. Growth behavior of ZnO layer was significantly dependent on the Ti 2 O 3 buffer-layer thickness, for example, dense columnar ZnO-grains were grown on the buffer layer thinner than 10 nm but the hexagonal pyramid-like grains were formed on the thin buffer layers below 2 nm. RHEED observations showed ZnO layer including the pyramid-like grains was epitaxially grown with single-domain on the thin buffer layer of 0.8 nm in the in-plane relationship of [1-100]ZnO//[1-100]Ti 2 O 3 //[0001]Al 2 O 3 , whereas the multi-domain was included in ZnO layer on the buffer layer above 10 nm.