2012
DOI: 10.1088/1742-6596/356/1/012019
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Surface topography and optical properties of Ge-Sb(As)-S-Te thin films by atomic-force microscopy and variable angle spectroscopic ellipsometry

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Cited by 3 publications
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“…Figure 3 indicates the value of the absorption coefficient, the increase/decrease of the Ge/Sb content upon photon energy incident for all the samples of Refractive index can be obtained using the normal incidence reflectance according to Fresnel's equations [12,13] computed by relation (4): Figure 5 shows the results obtained by the refractive index according to (4). The value of the refractive index and extinction coefficient decrease/ increase with Ge / Sb content [14][15][16][17]. The optical band gap E g was derived assuming indirect transitions between the edge of the valence and conduction band.…”
Section: Experimental Details and Resultsmentioning
confidence: 99%
“…Figure 3 indicates the value of the absorption coefficient, the increase/decrease of the Ge/Sb content upon photon energy incident for all the samples of Refractive index can be obtained using the normal incidence reflectance according to Fresnel's equations [12,13] computed by relation (4): Figure 5 shows the results obtained by the refractive index according to (4). The value of the refractive index and extinction coefficient decrease/ increase with Ge / Sb content [14][15][16][17]. The optical band gap E g was derived assuming indirect transitions between the edge of the valence and conduction band.…”
Section: Experimental Details and Resultsmentioning
confidence: 99%