Surface Texture-Induced Enhancement of Optical and Photoelectrochemical Activity of Cu2ZnSnS4 Photocathodes

Sarswat, Prashant K.; Deka, Nipon; Rao, S. Jagan Mohan; Free, Michael L.; Kumar, Gagan

doi:10.1007/s11664-017-5531-8

Cited by 7 publications

(3 citation statements)

References 46 publications

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“…The details on SEM images of these substrates can be found in earlier published reports. 15,16,18,20 Raman spectra of different materials (see Figures 2d-2f) also suggested phase purity and match well with earlier reported data. 15,18 Raman spectrum for CZTS thin film shows an intense major peak located at 339 cm −1 and two minor peaks at 375 cm −1 and 291 cm −1 .…”

Section: Resultssupporting

confidence: 91%

“…15,16,18,20 Raman spectra of different materials (see Figures 2d-2f) also suggested phase purity and match well with earlier reported data. 15,18 Raman spectrum for CZTS thin film shows an intense major peak located at 339 cm −1 and two minor peaks at 375 cm −1 and 291 cm −1 . For TNT substrate the peaks at ∼ 394 cm −1 , 515 cm −1 , and 638 cm −1 can be observed.…”

Section: Resultssupporting

confidence: 91%

“…Other details about CZTS film synthesis methods can be found elsewhere. 18,19 Fluorinated tin oxide (FTO) coated glass substrates were purchased from Pilkington Glass. P-type silicon substrates were purchased from Universal Wafers.…”

Section: Methodsmentioning

confidence: 99%

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Portable Scanning Vertical Probes for Localized Electrochemical Properties and Defects Analysis

Sarswat

Zhang

Free

2019

J. Electrochem. Soc.

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Defects and physicochemical analysis in large size semiconducting samples are challenges to effectively locate and often expensive techniques are utilized. Techniques such as EIS and Mott Schottky analysis are not very expensive but in these techniques, the sample is generally inserted in an electrolyte solution. However, the broad analysis produces broad results, and, therefore, the properties revealed in this way are the properties of the aggregate of the sample. The nature of semiconductor material (p-type or n-type) is also analyzed for the aggregate of the sample. Scanning electrochemical cell microscopy is one way to externally examine the properties of the substrate, but this technique mainly utilizes a double-walled pipette system and conductance current to map the substrate. In the present report, a single compartment tube securely sealed with Polytetrafluoroethylene membrane equipped with partially submerged counter and reference electrodes in the electrolyte of choice was utilized for testing. A variety of p and n-type semiconducting materials were examined externally and their properties, majority charge carriers' type, and electrochemical behavior were recorded. All preliminary results confirmed that this type of probe can be easily fabricated and modified according to the need and type of measurements as well as have the potential for market penetration.

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