“…In conventional solution technique, many of the commonly observed characteristic growth induced defect structures comprising growth sector boundaries [3], liquid inclusions [3,4], growth band [5], slip band [6], low angle grain boundaries [7], dislocations [8], vacancies [8], cracks, stacking faults [9] and twins can be attributed to impurities. Growth bands are layers of varying impurity content and it is usually observed in solution grown crystals caused by fluctuations in the growth conditions [10] as well as growth sector boundaries [11].…”