Surface structure determination with X-ray standing waves

Zegenhagen, J.

doi:10.1016/0167-5729(93)90025-k

Cited by 419 publications

(235 citation statements)

References 159 publications

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“…This causes f c as well as p c to be more sensitive to vertical displacements of the atoms with respect to the extended lattice planes. 22,34,49 Hence, thermal vibrations lead to a stronger reduction of the f c values. In addition, a small fraction of molecules at defect sites (which are more likely on this most open surface), which are in a structurally different adsorption geometry and lead to an incoherent contribution in the NIXSW curves, could play a role here.…”

Section: Resultsmentioning

confidence: 99%

Role of functional groups in surface bonding of planarπ-conjugated molecules

et al. 2012

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The trends in the bonding mechanism of 3,4,9,10-perylenetetracarboxylic acid dianhydride (PTCDA) to the Ag(111), Ag(100), and Ag(110) surfaces were analyzed on the basis of data obtained from x-ray standing waves and dispersion-corrected density functional theory. Of importance are the attractive local O-Ag bonds on the anhydride groups. They are the shorter, the more open the surface is, and lead even to partly repulsive interactions between the perylene core and the surface. In parallel, there is an increasing charge donation from the Ag surface into the π system of the PTCDA. This synergism explains the out-of-plane distortion of the adsorbed PTCDA and the surface buckling.

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Section: Resultsmentioning

confidence: 99%

Role of functional groups in surface bonding of planarπ-conjugated molecules

et al. 2012

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“…The most precise way to determine that distance experimentally is by means of normal incidence X-ray Standing Waves (XSW). 3,4 This technique has been applied to a number of molecules on various surfaces. [5][6][7][8][9][10][11][12][13] Here we report the use of XSW to determine the molecule-substrate distances in donor-acceptor molecular blends, which are not only highly relevant for many organic devices, but also have interfacial properties often differing from those of the corresponding single component layers.…”

Section: Introductionmentioning

confidence: 99%

Self-Assembly of Bicomponent Molecular Monolayers: Adsorption Height Changes and Their Consequences

et al. 2014

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Codeposition of two molecular species [CuPc (donor) and PFP (acceptor)] on noble metal (111) surfaces leads to the self-assembly of an ordered mixed layer with maximized donor-acceptor contact area. The main driving force behind this arrangement is assumed to be the intermolecular C-F ··· H-C hydrogen-bond interactions. Such interactions would be maximized for a coplanar molecular arrangement. However, precise measurement of molecule-substrate distances in the molecular mixture reveals significantly larger adsorption heights for PFP than for CuPc. Most surprisingly, instead of leveling to increase hydrogen bond interactions, the height difference is enhanced in mixed layers as compared to the heights found in single component CuPc and PFP layers, resulting in an overall reduced interaction with the underlying substrate. The influence of the increased height of PFP on the interface dipole is investigated through work function measurements.

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“…The shape of the FeK α fluorescence yield curve is quite similar to that of the reflectivity curve. One of the possible explanations of this experimental fact is that the implanted atoms are randomly distributed [4,7]. Figure 2 shows the FeKα fluorescence yield curve for the sample after annealing at 750°C.…”

Section: Xsw Resultsmentioning

confidence: 99%

“…reviews [4,7]). However, the interpretation of XSW results is in some cases quite a complicated and even not uniquely solvable problem [8].…”

Section: Introductionmentioning

confidence: 99%

X-ray Standing Waves and Rutherford backscattering Studies of the Structure of Si Single Crystals Implanted with Fe Ions

et al. 1996

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The X-ray standing wave and Rutherford backscattering spectroscopy in channelling geometry were applied for the investigation of the structure of silicon single crystals implanted with 80 keV Fe ions. Both methods were used for the determination of crystal damage and lattice location of implanted metal atoms before and alter thermal annealing. Both methods gave consistent results regarding the amorphization of Si due to the Fe-ion implantation. Moreover, using both methods some Fe substitution fraction was determined. The depth profiles of implanted atoms were compared to the results of computer simulations. Complementary use of X-ray standing wave and Rutherford backscattering spectroscopy channelling techniques for studies of radiation damage and lattice location of implanted atoms is discussed.

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Surface structure determination with X-ray standing waves

Cited by 419 publications

References 159 publications

Role of functional groups in surface bonding of planarπ-conjugated molecules

Role of functional groups in surface bonding of planarπ-conjugated molecules

Self-Assembly of Bicomponent Molecular Monolayers: Adsorption Height Changes and Their Consequences

X-ray Standing Waves and Rutherford backscattering Studies of the Structure of Si Single Crystals Implanted with Fe Ions

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