2017
DOI: 10.3390/ma10080906
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Surface Sensitive Techniques for Advanced Characterization of Luminescent Materials

Abstract: The important role of surface sensitive characterization techniques such as Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (XPS), time of flight scanning ion mass spectrometry (TOF-SIMS) and High resolution transmission electron microscopy (HRTEM) for the characterization of different phosphor materials is discussed in this short review by giving selective examples from previous obtained results. AES is used to monitor surface reactions during electron bombardment and also to determine th… Show more

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Cited by 8 publications
(4 citation statements)
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“…ZnO:Nd and ZnO:Er films are used to achieve NIR EL. The aforementioned multicolor and NIR EL originating from the impact excitation of the RE ions incorporated into the ZnO host can be activated with threshold voltages as low as ∼5 V. Another possible obstacle in the use of phosphor materials that has to be overcome is the degradation of phosphor materials with time in different environments and conditions …”
Section: Application Of Rare Earth Doped Znomentioning
confidence: 99%
“…ZnO:Nd and ZnO:Er films are used to achieve NIR EL. The aforementioned multicolor and NIR EL originating from the impact excitation of the RE ions incorporated into the ZnO host can be activated with threshold voltages as low as ∼5 V. Another possible obstacle in the use of phosphor materials that has to be overcome is the degradation of phosphor materials with time in different environments and conditions …”
Section: Application Of Rare Earth Doped Znomentioning
confidence: 99%
“…The EDX elemental distribution analysis were carried out with the intention to identify the presence of particular elements within commercial powder compounds, to which the luminescence effect discussed later will be assigned, rather than to identify their compositions fully, being out of this paper’s scope. Indeed, luminescent properties of pigments depend strongly on the chemical composition of the host material, as well as on the presence of particular dopant materials [23]. Due to the depicted heterogenicity, three regions of interest were selected for elemental analysis, including several pigment particles rather than particle sections, which gives a broader and more general view about the distribution of detected elements.…”
Section: Resultsmentioning
confidence: 99%
“…The presence of the rare earth element europium (Eu), known as a photoluminescent pigments’ dopant [24], was identified in the yellow-green and violet pigments. This element has strong luminescence intensity, which is affected by its oxidation state (the Eu 2+ wavelength position is matrix-sensitive, while the Eu 3+ emission position is not affected by change in the matrix [23]), as well as concentration. Besides Eu, the yellow-green pigment contains strontium (Sr), aluminium (Al) and oxygen (O), which suggest the presence of strontium aluminates.…”
Section: Resultsmentioning
confidence: 99%
“…Nevertheless, neither TOF-MS nor SIMS is sufficiently sensitive to distinguish chemical forms of elements. Such information is attainable via X-ray photoelectron spectroscopy (XPS); 42 however, these elemental composition and chemical form measurements are restricted to the particle's subsurface which extends mere nanometers beneath the surface, rendering chemical state measurements at greater depths unattainable. Chemical analysis of micrometersized particulates thus requires new approaches that can overcome limitations associated with microscope sensitivity and sample thickness.…”
mentioning
confidence: 99%